Nanoelectronics devices: More CMOS, Fusion CMOS and Beyond CMOS

被引:1
|
作者
Watanabe, Hisatsune
机构
关键词
D O I
10.1109/ASSCC.2009.5357243
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We are facing several difficulties with shrinking LSI chips, such as leakage currents/power consumption, variability, huge costs in R&D and production. Major semiconductor market will be absolutely dependent on further shrinking of Si CMOS transistors with improving transistor structures and lowering drive voltage, increasing wafer diameter and 3D stacking package structures. This way is "More CMOS" (More Moore) strategy. On the other hand, the semiconductor market will expand by integrating CMOS with new functional materials, such as optical-, flexible-, spin-mechanical-, bio-, and nano-carbon devices. This way is "Fusion CMOS". "Beyond CMOS" circuit algorithm is intensively exploited mainly by academic sites. For acceleration of the commercialization of those R&D efforts for More CMOS, Fusion CMOS and Beyond CMOS, we need a new type of integration verification services for R&D people, particularly for university people. This might be a global need in the forthcoming nanoelectronics era.
引用
收藏
页码:5 / 8
页数:4
相关论文
共 50 条
  • [31] BREAKDOWN OF CMOS DEVICES
    SEDDON, P
    WIRELESS WORLD, 1973, 79 (1456): : 497 - 497
  • [32] USING CMOS DEVICES
    WILLIAMS, DS
    WIRELESS WORLD, 1973, 79 (1457): : 533 - 534
  • [33] MORE ON CMOS BUSES
    ELWELL, JD
    ELECTRONIC PRODUCTS MAGAZINE, 1986, 29 (05): : 11 - 11
  • [34] A CMOS Fuse for Safe Release of CMOS-MEMS Devices
    Qu, Peng
    Qu, Hongwei
    2017 IEEE SENSORS, 2017, : 196 - 198
  • [35] Can Beyond-CMOS Devices Illuminate Dark Silicon?
    Perricone, Robert
    Hu, X. Sharon
    Nahas, Joseph
    Niemier, Michael
    PROCEEDINGS OF THE 2016 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2016, : 13 - 18
  • [36] Nontraditional Computation Using Beyond-CMOS Tunneling Devices
    Sedighi, Behnam
    Hu, Xiaobo Sharon
    Nahas, Joseph J.
    Niemier, Michael
    IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS, 2014, 4 (04) : 438 - 449
  • [38] Uniform Methodology for Benchmarking Beyond-CMOS Logic Devices
    Nikonov, Dmitri E.
    Young, Ian A.
    2012 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2012,
  • [39] Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking
    Nikonov, Dmitri E.
    Young, Ian A.
    PROCEEDINGS OF THE IEEE, 2013, 101 (12) : 2498 - 2533
  • [40] Novel devices and process for 32 nm CMOS technology and beyond
    YangYuan Wang
    Xing Zhang
    XiaoYan Liu
    Ru Huang
    Science in China Series F: Information Sciences, 2008, 51 : 743 - 755