共 50 条
- [2] Imaging defects on CaF2(111) surface with frequency modulation atomic force microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (3B): : 1986 - 1991
- [4] CHARACTERIZATION OF INITIAL-STAGES OF GROWTH OF CAF2 ON SI(111) SUBSTRATES BY ATOMIC-FORCE MICROSCOPY MICROSCOPY OF SEMICONDUCTING MATERIALS 1993, 1993, (134): : 613 - 616
- [8] MECHANISMS OF STRAIN RELAXATION IN EPITAXIAL CAF2/SI(111) STUDIED WITH ATOMIC FORCE MICROSCOPY HELVETICA PHYSICA ACTA, 1992, 65 (06): : 822 - 823
- [9] Annealing of CaF2 adlayers grown on Si(111):: investigations of the morphology by atomic force microscopy THIN FILMS EPITAXIAL GROWTH AND NANOSTRUCTURES, 1999, 79 : 120 - 123