Measurement of thermal parameters and mechanical properties of polymers by atomic force microscopy

被引:10
|
作者
Meincken, M
Balk, LJ
Sanderson, RD
机构
[1] Univ Stellenbosch, Associated Ctr Macromol & Mat, Dept Chem, UNESCO, ZA-7602 Matieland, South Africa
[2] Berg Univ Wuppertal, Fachbereich Elektrotech, D-42097 Wuppertal, Germany
关键词
AFM; glass transition; localized measurement; resonance frequency shift; layered systems;
D O I
10.1002/sia.1620
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A novel technique has been developed to determine thermal transitions locally, e.g. the glass transition of polymers, with atomic force microscopy (AFM). The microscope was operated in stationary non-contact mode, using it like a dynamic mechanical analyser on a molecular scale, thereby measuring the resonance frequency of the AFM cantilever, which oscillates above the sample surface, as a function of temperature. The thermal transitions of the underlying polymer are clearly visible as a change in the resonance frequency. Using the AFM in this mode allows the determination of the thermal properties of a material at a specific spot on the sample on a molecular scale. Measurements were performed on different polymers, polymer blends, structured polymers, layered systems and thin films. Copyright (C) 2003 John Wiley Sons, Ltd.
引用
收藏
页码:1034 / 1040
页数:7
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