Study of electron behavior in a pulsed ion sheath

被引:11
|
作者
Kar, S. [1 ]
Mukherjee, S. [1 ]
机构
[1] Inst Plasma Res, FCIPT, Bhat 382428, Gandhinagar, India
关键词
D O I
10.1063/1.2934640
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
In many plasma processing applications, like plasma immersion ion implantation (PIII), the substrate is immersed in low pressure plasma and is biased with negative voltage pulses. In typical PIII, the pulse duration is much larger than the ion response time, and hence the ion matrix sheath expands and ion implantation happens on the biased substrate. It is assumed that for pulse duration shorter than ion response times, the ions remain stationary and electrons are repelled by the negative bias. In the present investigation, the negative pulse duration is varied between ion and electron plasma response times; so as to study the electron behavior assuming ions are stationary. The results indicate that the electrons that are lost to the walls come from the ion matrix sheath and probably from the bulk plasma as well. The pulse duration, when it is less than the ion response time, plays a crucial role in determining the number of electrons lost to the walls. (C) 2008 American Institute of Physics.
引用
收藏
页数:6
相关论文
共 50 条
  • [21] Superthermal and trapping phenomena in an electron-ion plasma sheath
    Haque, Asif Shah Q.
    Mahmood, S.
    PHYSICA SCRIPTA, 2014, 89 (01)
  • [22] ION AND ELECTRON DYNAMICS IN THE SHEATH OF RADIOFREQUENCY GLOW-DISCHARGES
    WILD, C
    KOIDL, P
    JOURNAL OF APPLIED PHYSICS, 1991, 69 (05) : 2909 - 2922
  • [23] Generation of focusing ion beams by magnetized electron sheath acceleration
    Weichman, K.
    Santos, J. J.
    Fujioka, S.
    Toncian, T.
    Arefiev, A., V
    SCIENTIFIC REPORTS, 2020, 10 (01)
  • [24] Generation of focusing ion beams by magnetized electron sheath acceleration
    K. Weichman
    J. J. Santos
    S. Fujioka
    T. Toncian
    A. V. Arefiev
    Scientific Reports, 10
  • [25] RESONANCE BEHAVIOR OF ION-SHEATH CAPACITANCE NEAR PLASMA ION FREQUENCY
    OLIVER, BM
    CLEMENTS, RM
    JOURNAL OF APPLIED PHYSICS, 1973, 44 (03) : 1128 - 1132
  • [26] Characteristics and analysis of the sheath scaling evolution in pulsed bias arc ion plating
    Qi Dong
    Wang Ninghui
    Lin Guoqiang
    Dong Chuang
    ACTA METALLURGICA SINICA, 2006, 42 (08) : 861 - 864
  • [27] Ion dynamics of pulsed plasma source ion implantation in the sheath of a hemispherical bowl-shaped target
    Liu, CS
    Wang, DZ
    SURFACE & COATINGS TECHNOLOGY, 2003, 171 (1-3): : 119 - 123
  • [28] Dependence of ion sheath collapse on secondary electron emission in plasma immersion ion implantation
    Kwok, Dixon T. K.
    Pu, Shihao
    Fu, Ricky K. Y.
    Jin, Fanya
    Chu, Paul K.
    APPLIED PHYSICS LETTERS, 2007, 90 (13)
  • [29] Pulsed evaporative cooling of ion cloud in an electron beam ion trap
    Kinugawa, T
    Currell, FJ
    Ohtani, S
    PHYSICA SCRIPTA, 2001, T92 : 102 - 104
  • [30] TEMPORAL BEHAVIOR OF THE ELECTRON AND NEGATIVE-ION DENSITIES IN A PULSED RADIOFREQUENCY CF4 PLASMA
    KONO, A
    HAVERLAG, M
    KROESEN, GMW
    DEHOOG, FJ
    JOURNAL OF APPLIED PHYSICS, 1991, 70 (06) : 2939 - 2946