Perturbation method for dielectric constant measurement of thick-film dielectric materials at microwave frequencies

被引：3
|
作者：
Li, D
Free, CE
Pitt, KEG
Barnwell, PG
机构：
[1] Middlesex Univ, London N11 2NQ, England
[2] Heraeus Inc, Cermalloy Div, W Conshohocken, PA 19428 USA
来源：
ELECTRONICS LETTERS | 1998年 / 34卷 / 21期
关键词：
D O I：
10.1049/el:19981392
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A novel technique, using a cavity perturbation method, for measuring the relative permittivity of dielectric thick-film materials is presented. Measurement data have been obtained at X-band frequencies for two kinds of dielectric thick-film material. The method combines simplicity with high accuracy and has the potential to measure films as thin as 20 mu m.
引用
收藏
页码：2042 / 2044
页数：3
相关论文
共 50 条
  • [1] MEASUREMENT OF DIELECTRIC CONSTANT OF THIN FILM MATERIALS AT MICROWAVE FREQUENCIES
    Jin, H.
    Dong, S. R.
    Wang, D. M.
    [J]. JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, 2009, 23 (5-6) : 809 - 817
  • [2] THICK-FILM CAPACITOR DIELECTRIC MATERIALS
    SAYERS, P
    [J]. AMERICAN CERAMIC SOCIETY BULLETIN, 1983, 62 (08): : 876 - 876
  • [3] ON MICROWAVE MEASUREMENT OF DIELECTRIC CONSTANT BY MEANS OF PERTURBATION METHOD
    YAMANAKA, H
    [J]. ELECTRONICS & COMMUNICATIONS IN JAPAN, 1967, 50 (12): : 57 - &
  • [4] METHOD MEASURING DIELECTRIC CONSTANT AT MICROWAVE FREQUENCIES BY MEANS OF PERTURBATION METHOD
    FALKVIK, I
    [J]. PROCEEDINGS OF THE IEEE, 1964, 52 (02) : 202 - &
  • [5] Measurement of dielectric constant and loss factor of the dielectric material at microwave frequencies
    Kumar, A.
    Sharma, S.
    Singh, G.
    [J]. PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER, 2007, 69 : 47 - 54
  • [6] Dielectric constant measurement for thin material at microwave frequencies
    Chung, B.-K.
    [J]. PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER, 2007, 75 : 239 - 252
  • [7] THICK-FILM CAPACITOR WITH A RUTILIUM DIELECTRIC
    BOREK, R
    LICZNERSKI, B
    RZASA, B
    [J]. MICROELECTRONICS RELIABILITY, 1972, 11 (06) : 511 - +
  • [8] Measurement of Dielectric Properties for Thick Ceramic Film on an Substrate at Microwave Frequencies by Applying the Mode-matchig Method
    Shibata, Kouji
    Kobayashi, Masaki
    [J]. 2016 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO), 2016,
  • [9] RELATIVE PERMITTIVITY MEASUREMENT OF THICK-FILM DIELECTRICS AT MICROWAVE-FREQUENCIES
    HUANG, H
    FREE, CE
    PITT, KEG
    BERZINS, AR
    SHORTHOUSE, GP
    [J]. ELECTRONICS LETTERS, 1995, 31 (21) : 1812 - 1814
  • [10] Measurement of the dielectric constant and loss tangent of high dielectric-constant materials at terahertz frequencies
    Bolivar, PH
    Brucherseifer, M
    Rivas, JG
    Gonzalo, R
    Ederra, I
    Reynolds, AL
    de Maagt, P
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2003, 51 (04) : 1062 - 1066
12345