Efficient Metafilm/Metasurface Characterization for Obliquely Incident TE Waves via Surface Susceptibility Models

被引：12

作者：

Dimitriadis, Alexandros I. ^{[1
]}

Kantartzis, Nikolaos V. ^{[1
]}

Rekanos, Ioannis T. ^{[2
]}

Tsiboukis, Theodoros D. ^{[1
]}

机构：

[1] Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, GR-54124 Thessaloniki, Greece

[2] Aristotle Univ Thessaloniki, Div Phys, Sch Engn, GR-54124 Thessaloniki, Greece

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2012年 / 48卷 / 02期

关键词：

Metafilm; metasurface; oblique incidence; particle polarizabilities; surface susceptibility;

D O I：

10.1109/TMAG.2011.2175374

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A generalized methodology for the rigorous characterization of metafilms/metasurfaces through a set of electric and magnetic surface susceptibilities is presented in this paper. According to the novel formulation, the particle polarizabilities of the metafilm are extracted from the S-parameters of a normally incident plane wave and are efficiently related to the corresponding surface susceptibilities. Then, the resulting model is employed for the determination of the scattering parameters for obliquely incident waves. Numerical simulations of diverse metamaterial unit cells are performed to validate the proposed scheme and reveal its accuracy and applicability merits.

引用

页码：367 / 370

页数：4

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