Thick-film temperature sensors and LTCC substrates - Evaluation and characterization

被引：0

作者：

Hrovat, Marko ^{[1
]}

Belavic, Darko ^{[2
]}

Kita, Jaroslaw ^{[3
]}

Holc, Janez ^{[1
]}

Cilensek, Jena ^{[1
]}

Golonka, Leszek ^{[4
]}

Dziedzic, Andrzej ^{[4
]}

机构：

[1] Jozef Stefan Inst, Jamova 39, Ljubljana 1000, Slovenia

[2] HIPOT R&D, Sentjemej 8310, Slovakia

[3] Univ Bayreuth, D-95440 Bayreuth, Germany

[4] Wroclaw Univ Technol, PL-50370 Wroclaw, Poland

来源：

2007 30TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY | 2007年

关键词：

D O I：

10.1109/ISSE.2007.4432822

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The electrical and microstructural characteristics of 1 kohm/sq. thick-film thermistors with high positive (PTC) and negative (NTC) temperature coefficients of resistivity (TCR) fired on "green" LTCC (Low-Temperature Cofired Ceramics) substrates were evaluated Electrical characteristics, Le., sheet resistivities, TCRs and noise indices were measured Microstructures of thick-films were investigated by scanning electron microscopy (SEM and analysed by Energy Dispersive X-ray analysis (EDS). Functional phases in thermistors were determined by X-ray powder diffraction analysis. Obtained results were compared with characteristics of thick film thermistors fired on relatively inert alumina substrates which were used as a reference.

引用

页码：65 / +

页数：2

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