X-ray mirror development and testing for the ATHENA mission

被引:10
|
作者
Ferreira, Desiree Della Monica [1 ]
Jakobsen, Anders C. [1 ]
Massahi, Sonny [1 ]
Christensen, Finn E. [1 ]
Shortt, Brian [2 ]
Garnaes, Jorgen [3 ]
Torras-Rosell, Antoni [3 ]
Krumrey, Michael [4 ]
Cibik, Levent [4 ]
Marggraf, Stefanie [4 ]
机构
[1] Tech Univ Denmark, DTU Space, Bygn 327, DK-2800 Lyngby, Denmark
[2] European Space Agcy ESTEC, Keplerlaan 1,POB 299, NL-2200 AG Noordwijk, Netherlands
[3] Danish Fundamental Metrol Ltd, Matemat Torvet 307, DK-2800 Lyngby, Denmark
[4] PTB, Abbestr 2-12, D-10587 Berlin, Germany
关键词
ATHENA; SPO; AFM; XRR; coatings; roughness; Ir/B4C; Pt/B4C; W/Si and W/B4C;
D O I
10.1117/12.2232962
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This study reports development and testing of coatings on silicon pore optics (SPO) substrates including pre and post coating characterisation of the x-ray mirrors using Atomic Force Microscopy (AFM) and X-ray reflectometry (XRR) performed at the 8 keV X-ray facility at DTU Space and with synchrotron radiation in the laboratory of PTB at BESSY II. We report our findings on surface roughness and coating reflectivity of Ir/B4C coatings considering the grazing incidence angles and energies of ATHENA and long term stability of Ir/B4C, Pt/B4C, W/Si and W/B4C coatings.
引用
收藏
页数:13
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