A novel technique of image quality objective measurement by wavelet analysis throughout the spatial frequency range

被引:2
|
作者
Luo, GY [1 ]
机构
[1] Buckinghamshire Chilterns Univ Coll, Fac Technol, High Wycombe HP11 2JZ, Bucks, England
来源
关键词
image quality; wavelet analysis; fast lifting wavelet; spatial frequency deconstruction; quality measurement;
D O I
10.1117/12.585271
中图分类号
TB8 [摄影技术];
学科分类号
0804 ;
摘要
An essential determinant of the value of surrogate digital images is their quality. Image quality measurement has become crucial for most image processing applications. Over the past years, there have been many attempts to develop models or metrics for image quality that incorporate elements of human visual sensitivity. However, there is no current standard and objective definition of spectral image quality. This paper proposes a reliable automatic method for objective image quality measurement by wavelet analysis throughout the spatial frequency range. This is done by a detailed analysis of an image for a wide range of spatial frequency content, using a combination of modulation transfer function (MTF), brightness, contrast, saturation, sharpness and noise, as a more revealing metric for quality evaluation. A fast lifting wavelet algorithm is developed for computationally efficient spatial frequency analysis, where fine image detail corresponding to high spatial frequencies and image sharpness in regard to lower and mid-range spatial frequencies can be examined and compared accordingly. The wavelet frequency deconstruction is actually to extract the feature of edges in sub-band images. The technique provides a means to relate the quality of an image to the interpretation and quantification throughout the frequency range, in which the noise level is estimated in assisting with quality analysis. The experimental results of using this method for image quality measurement exhibit good correlation to subjective visual quality assessments.
引用
收藏
页码:173 / 184
页数:12
相关论文
共 50 条
  • [41] Novel spatial scanning technique for surface roughness measurement
    Xie, F
    Zhang, W
    Jiang, XQ
    Zhang, L
    Bennion, I
    2003 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2, 2003, : 97 - 98
  • [42] Blurriness measurement in frequency domain for image quality assessment
    Tahir, Qadri Muhammad
    Noman, Mehmood Syed
    Tahir, Aisha
    INTERNATIONAL CONFERENCE ON GRAPHIC AND IMAGE PROCESSING (ICGIP 2011), 2011, 8285
  • [43] Applications of frequency dependent wavelet shrinkage to analyzing quality of image registration
    Dinov, ID
    Sumners, DW
    SIAM JOURNAL ON APPLIED MATHEMATICS, 2001, 62 (02) : 367 - 384
  • [44] Novel method for misalignments measurement on imaging systems through quality image analysis
    Oteo, Esther
    Fernandez-Dorado, Jose
    Arasa, J.
    Blanco, P.
    Pizarro, C.
    OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION VII, 2011, 8082
  • [45] Panchromatic and multispectral image fusion using the spatial frequency and the a trous wavelet transform
    Massout, Samia
    Smara, Youcef
    JOURNAL OF APPLIED REMOTE SENSING, 2021, 15 (03)
  • [46] Image Watermarking through Joint Spatial Segmentation and Wavelet Packet Frequency Division
    Amini, Marzieh
    Sadreazami, Hamidreza
    PROCEEDINGS OF 2012 IEEE 11TH INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING (ICSP) VOLS 1-3, 2012, : 632 - +
  • [47] A Novel Technique for Digital Image Watermarking in Frequency Domain
    Singh, Amit Kumar
    Dave, Mayank
    Mohan, Anand
    2012 2ND IEEE INTERNATIONAL CONFERENCE ON PARALLEL, DISTRIBUTED AND GRID COMPUTING (PDGC), 2012, : 424 - 429
  • [48] Research on automated image registration technique for visual image based on wavelet analysis
    Niu, Yongsheng
    Ni, Guoqiang
    Gaojishu Tongxin/High Technology Letters, 1999, 9 (09): : 24 - 27
  • [49] Quality Measurement for High Dynamic Range Omnidirectional Image Systems
    Cao, Liuyan
    Jiang, Gangyi
    Jiang, Zhidi
    Yu, Mei
    Qi, Yubin
    Ho, Yo-Sung
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 70
  • [50] Improvement of TDOA measurement using wavelet denoising with a novel thresholding technique
    Wu, SQ
    So, HC
    Ching, PC
    1997 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH, AND SIGNAL PROCESSING, VOLS I - V: VOL I: PLENARY, EXPERT SUMMARIES, SPECIAL, AUDIO, UNDERWATER ACOUSTICS, VLSI; VOL II: SPEECH PROCESSING; VOL III: SPEECH PROCESSING, DIGITAL SIGNAL PROCESSING; VOL IV: MULTIDIMENSIONAL SIGNAL PROCESSING, NEURAL NETWORKS - VOL V: STATISTICAL SIGNAL AND ARRAY PROCESSING, APPLICATIONS, 1997, : 539 - 542