Dependable design technique for system-on-chip

被引:11
|
作者
Kubalik, Pavel [1 ]
Kubatova, Hana [1 ]
机构
[1] Czech Tech Univ, Dept Comp Sci & Engn, Fac Elect Engn, Prague 12135 2, Czech Republic
关键词
reliable digital design; FPGA; dependability model; dependability calculations; on-line testing; fault security; self-testing; totally self-checking; single even upset; reconfiguration;
D O I
10.1016/j.sysarc.2007.09.003
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A technique for highly reliable digital design for two FPGAs under a processor control is presented. Two FPGAs are used in a duplex configuration system design, but better dependability parameters are obtained by the combination of totally self-checking blocks based oil a parity predictor. Each FPGA can be reconfigured when a SEU fault is detected. This reconfiguration is controlled by a control unit implemented in a processor. Combinational circuit benchmarks have been considered in all our experiments and computations. All our experimental results are obtained from a XILINX FPGA implementation using EDA tools. The dependability model and dependability calculations are presented to document the improved reliability parameters. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:452 / 464
页数:13
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