Interface superconductivity in La1.48Nd0.4Sr0.12CuO4/La1.84Sr0.16CuO4 bilayers

被引：12
|
作者：
Rout, P. K. [1 ]
Budhani, R. C. [1 ,2 ]
机构：
[1] Indian Inst Technol, Condensed Matter Low Dimens Syst Lab, Dept Phys, Kanpur 208016, Uttar Pradesh, India
[2] Natl Phys Lab, New Delhi 110012, India
来源：
PHYSICAL REVIEW B | 2010年 / 82卷 / 02期
关键词：
2-DIMENSIONAL SYSTEMS; PENETRATION DEPTH; AC-SUSCEPTIBILITY; TEMPERATURE; LA2-XSRXCUO4; OXIDES; HETEROSTRUCTURES; DYNAMICS; FILMS;
D O I：
10.1103/PhysRevB.82.024518
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We identify a distinct superconducting phase at the interface of a La1.48Nd0.4Sr0.12CuO4/La1.84Sr0.16CuO4 epitaxial bilayer system using ac screening measurements. A model based on interdiffusion of quasiparticles and condensate at the interface yields a thickness of similar to 25 nm for the interfacial layer. Two-dimensional superconductivity of the interface layer appears to be governed by Kosterlitz-Thouless-Berezinskii transition. A parallel magnetic field suppresses the superconducting transition temperature of this layer with a pair-breaking parameter alpha varying as H-2.
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页数：5
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