共 50 条
- [3] Oxygen distribution in nickel silicide films analyzed by time-of-flight secondary ion mass spectrometry ADVANCED METALLIZATION CONFERENCE 2007 (AMC 2007), 2008, 23 : 391 - 395
- [6] Time-of-flight secondary ion mass spectrometry of fullerenes EUROPEAN MASS SPECTROMETRY, 1995, 1 (05): : 487 - 492
- [7] SECONDARY ION MASS-SPECTROMETRY BY TIME-OF-FLIGHT INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 53 (SEP): : 125 - 134
- [10] A SECONDARY ION TIME-OF-FLIGHT MASS-SPECTROMETER WITH AN ION MIRROR INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1988, 85 (01): : 43 - 67