Residual Flatness Error correction in three dimensional Imaging Confocal Microscopes

被引:4
|
作者
Bermudez, Carlos [1 ]
Felgner, Andre [2 ]
Martinez, Pol [1 ]
Matilla, Aitor [1 ]
Cadevall, Cristina [1 ]
Artigas, Roger [1 ]
机构
[1] Sensofar Tech SL, Barcelona, Spain
[2] PTB, Braunschweig, Germany
来源
关键词
Imaging systems; Confocal Microscopy; Metrology; Surface measurements; Calibration;
D O I
10.1117/12.2306903
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Imaging Confocal Microscopes (ICM) are highly used for the assessment of three-dimensional measurement of technical surfaces. The benefit of an ICM in comparison to an interferometer is the use of high numerical aperture microscope objectives, which allows retrieving signal from high slope regions of a surface. When measuring a flat sample, such as a high-quality mirror, all ICM's show a complex shape of low frequencies instead of a uniform flat result. Such shape, obtained from a lambda/10, Sa < 0.5 nm calibration mirror is used as a reference for being subtracted from all the measurements, according to ISO 25178-607. This is true and valid only for those surfaces that have small slopes. When measuring surfaces with varying local slopes or tilted with respect to the calibration, the flatness error calibration is no longer valid, leaving what is called the residual flatness error. In this paper we show that the residual flatness error on a reference sphere measured with a 10X can make the measurement of the radius to have up to 10% error. We analyzed the sources that generate this effect and proposed a method to correct it: we measured a tilted mirror with several angles and characterized the flatness error as a function of the distance to the optical axis, and the tilt angle. New measurements take into account such characterization by assessing the local slopes. We tested the method on calibrated reference spheres and proved to provide correct measurements. We also analyzed this behavior in Laser Scan as well on Microdisplay Scan confocal microscopes.
引用
收藏
页数:10
相关论文
共 50 条
  • [41] Three-dimensional imaging of carbon nanostructures by scanning confocal electron microscopy
    Hashimoto, Ayako
    Shimojo, Masayuki
    Mitsuishi, Kazutaka
    Takeguchi, Masaki
    [J]. JOURNAL OF APPLIED PHYSICS, 2009, 106 (08)
  • [42] Three dimensional imaging of molecular order of the cytoskeleton by confocal fluorescence polarization microscopy
    Mehta, S. B.
    Fischer, R. S.
    Spira, F. G.
    Gerlich, D. W.
    Waterman, C. M.
    Oldenbourg, R.
    [J]. MOLECULAR BIOLOGY OF THE CELL, 2015, 26
  • [43] Confocal microscopy on the beamline: novel three-dimensional imaging and sample positioning
    Khan, I.
    Gillilan, R.
    Kriksunov, I.
    Williams, R.
    Zipfel, W. R.
    Englich, U.
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2012, 45 : 936 - 943
  • [44] Three-dimensional Imaging Confocal profiler without in-plane scanning
    Martinez, Pol
    Bermudez, Carlos
    Cadevall, Cristina
    Matilla, Aitor
    Artigas, Roger
    [J]. OPTICS AND PHOTONICS FOR ADVANCED DIMENSIONAL METROLOGY, 2021, 11352
  • [45] Generic and flexible self-correction method for nonlinearity-induced phase error in three-dimensional imaging
    Wang, Jianhua
    Xu, Peng
    Yang, Yanxi
    [J]. CHINESE OPTICS LETTERS, 2024, 22 (06)
  • [46] Generic and flexible self-correction method for nonlinearity-induced phase error in three-dimensional imaging
    王建华
    徐鹏
    杨延西
    [J]. ChineseOpticsLetters, 2024, 22 (06) : 134 - 140
  • [47] Optimization for imaging through scattering media for confocal microscopes with divided elliptical apertures
    Tang, Hengjie
    Wu, Chenxue
    Gong, Wei
    Zheng, Yao
    Zhu, Xinpei
    Wang, Jiahao
    Si, Ke
    [J]. JOURNAL OF BIOPHOTONICS, 2018, 11 (05)
  • [48] THREE-DIMENSIONALLY IMAGING ELECTRON-MICROSCOPES
    HOPPE, W
    [J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (06): : 919 - &
  • [49] Three-dimensional measurement system based on structured light and error correction
    Wu, Wenkang
    Wang, Yongjun
    Yu, TingTing
    Zhao, Hongyan
    Liu, Xinyu
    Pan, Yucheng
    Niu, Xiaoyuan
    Li, Jun
    Xu, Hui
    Xin, Xiangjun
    [J]. TENTH INTERNATIONAL CONFERENCE ON INFORMATION OPTICS AND PHOTONICS, 2018, 10964
  • [50] GPS Error Correction With Pseudorange Evaluation Using Three-Dimensional Maps
    Miura, Shunsuke
    Hsu, Li-Ta
    Chen, Feiyu
    Kamijo, Shunsuke
    [J]. IEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMS, 2015, 16 (06) : 3104 - 3115