A new scheme for the exit-wave reconstruction from a small set of focus series of HREM images

被引：1

作者：

Lin, F

Chen, Q

Peng, LM ^{[1
]}

机构：

[1] Peking Univ, Key Lab Phys & Chem Nanodevices, Beijing 100871, Peoples R China

[2] Peking Univ, Dept Elect, Beijing 100871, Peoples R China

来源：

PRICM 5: THE FIFTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, PTS 1-5 | 2005年 / 475-479卷

关键词：

HREM; image reconstruction; genetic algorithm;

D O I：

10.4028/www.scientific.net/MSF.475-479.4059

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A new procedure is proposed for the exit electron wave reconstruction using a small set of high-resolution electron microscopy (HREM) images. This procedure is similar to that proposed by van Dyck and coworkers, but the relative shifts between different HREM images are obtained via the genetic algorithm instead of the more widely used cross-correlation function (XCF) method. The new procedure is demonstrated using simulated HREM images with added noise, and shown to be able to deal with situation where the scheme based on the method of XCF is not applicable.

引用

页码：4059 / 4062

页数：4