Weighted part mutual information related component analysis for quality-related process monitoring

被引:9
|
作者
Wang, Yanwen [1 ]
Zhou, Donghua [1 ,2 ]
Chen, Maoyin [1 ]
Wang, Min [1 ]
机构
[1] Tsinghua Univ, Dept Automat, Beijing 100084, Peoples R China
[2] Shandong Univ Sci & Technol, Coll Elect Engn & Automat, Qingdao 266590, Peoples R China
基金
中国国家自然科学基金;
关键词
Process monitoring; Quality-related fault detection; Part mutual information; Related component analysis; Bayesian inference weighted fusion; FAULT-DETECTION; DIAGNOSIS; PROJECTION; NETWORK;
D O I
10.1016/j.jprocont.2020.03.001
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Industrial products have become the core of today's highly competitive international society, but quality-related faults happened in practical industrial processes heavily affect product quality. In this paper, we will consider the problem of the detection of quality-related faults. Inspired by part mutual information (PMI), we develop a process monitoring method called weighted PMI based related component analysis (WPMI-RCA). Firstly, combining PMI and Bayesian weighted fusion, process variables strongly related to quality are selected with the supervision of multi-quality indicators. Then, the selected variables are modeled by related component analysis (RCA) and thus orthogonal related components (RCs) containing the main information of quality variations can be obtained. The process data space can be divided into two subspaces and the monitoring statistics are developed for the quality-related fault detection. Finally, the validity of WPMI-RCA is demonstrated by a numerical example and the benchmark Tennessee Eastman process (TEP). The proposed method can improve the detection rates of quality-related faults and significantly reduce the nuisance detections. It may be helpful to improve the management efficiency for practical industrial processes. (C) 2020 Elsevier Ltd. All rights reserved.
引用
收藏
页码:111 / 123
页数:13
相关论文
共 50 条
  • [31] Kernel-based PMP structure for nonlinear industrial quality-related process monitoring
    Ma, Hao
    Wang, Yan
    Chen, Hongtian
    Yuan, Jie
    Ji, Zhicheng
    ISA TRANSACTIONS, 2023, 141 : 184 - 196
  • [32] A Quality-Related Fault Detection Approach Based on Dynamic Least Squares for Process Monitoring
    Jiao, Jianfang
    Yu, Han
    Wang, Guang
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2016, 63 (04) : 2625 - 2632
  • [33] Nonlinear Dynamic Quality-Related Process Monitoring Based on Dynamic Total Kernel PLS
    Liu, Yan
    Chang, Yuqing
    Wang, Fuli
    2014 11TH WORLD CONGRESS ON INTELLIGENT CONTROL AND AUTOMATION (WCICA), 2014, : 1360 - 1365
  • [34] Quality-Related Process Monitoring Based on Total Kernel PLS Model and Its Industrial Application
    Peng, Kaixiang
    Zhang, Kai
    Li, Gang
    MATHEMATICAL PROBLEMS IN ENGINEERING, 2013, 2013
  • [35] Quality-related batch process monitoring based on multi-way orthogonal signal correction enhanced total principal component regression
    Zhang, Yan
    Zhao, Xiaoqiang
    Hui, Yongyong
    Cao, Jie
    MEASUREMENT & CONTROL, 2023, 56 (9-10): : 1562 - 1571
  • [36] Quality-related monitoring of distributed process systems using dynamic concurrent partial least squares
    Yang, Jie
    Wang, Jinyong
    Sha, Jiulong
    Dai, Hongqi
    Liu, Hongbin
    COMPUTERS & INDUSTRIAL ENGINEERING, 2022, 164
  • [37] Global-local preserving method of quality-related maximization and its application for process monitoring
    Yang, Jiandong
    Yan, Xuefeng
    CONTROL ENGINEERING PRACTICE, 2025, 154
  • [38] Generalized Semisupervised Self-Optimizing Kernel Model for Quality-Related Industrial Process Monitoring
    Wei, Chihang
    Song, Zhihuan
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2020, 67 (12) : 10876 - 10886
  • [39] How companies use the information about quality-related costs
    Pires, Antonio Ramos
    Novas, Jorge
    Saraiva, Margarida
    Coelho, Aida
    TOTAL QUALITY MANAGEMENT & BUSINESS EXCELLENCE, 2017, 28 (5-6) : 501 - 521
  • [40] Statistical Diagnosis for Quality-Related Faults in BIW Assembly Process
    Fu, Yu-kai
    Yang, Guang-Hong
    Ma, Hong-Jun
    Chen, Hao
    Zhu, Bo
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2023, 70 (01) : 898 - 906