Modular Sum Codes in Building Testable Discrete Systems

被引：0
|
作者：
Sapozhnikov, Valery [1 ]
Sapozhnikov, Vladimir [1 ]
Efanov, Dmitry [1 ]
机构：
[1] Petersburg State Transport Univ, Automat & Remote Control Railways Dept, St Petersburg, Russia
来源：
PROCEEDINGS OF 2015 IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS) | 2015年
关键词：
CHECKING; CIRCUITS; SUMMATION;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this article the study of characteristics of modular sum codes for error detection in concurrent error detection (CED) systems is presented. The article provides the classification of sum codes with arbitrary modulus values. It also gives the definition of common patterns in detection ability of all modular sum codes. Determined characteristics of modular sum codes are supported by the results of tests with benchmarks of LGSynth '89 system.
引用
收藏
页数：7
相关论文
共 50 条
  • [31] Tradeoff Constructions for Quantum Locally Testable Codes
    Wills, Adam
    Lin, Ting-Chun
    Hsieh, Min-Hsiu
    IEEE TRANSACTIONS ON INFORMATION THEORY, 2025, 71 (01) : 426 - 458
  • [32] Decomposition of discrete devices for testable transformation
    Aksenova, GP
    Khalchev, VF
    AUTOMATION AND REMOTE CONTROL, 1999, 60 (07) : 1012 - 1020
  • [33] Almost orthogonal linear codes are locally testable
    Kaufman, T
    Litsyn, S
    46TH ANNUAL IEEE SYMPOSIUM ON FOUNDATIONS OF COMPUTER SCIENCE, PROCEEDINGS, 2005, : 317 - 326
  • [34] Tolerant Linearity Testing and Locally Testable Codes
    Kopparty, Swastik
    Saraf, Shubhangi
    APPROXIMATION, RANDOMIZATION, AND COMBINATORIAL OPTIMIZATION: ALGORITHMS AND TECHNIQUES, 2009, 5687 : 601 - +
  • [35] Limitation on the Rate of Families of Locally Testable Codes
    Ben-Sasson, Eli
    PROPERTY TESTING: CURRENT RESEARCH AND SURVEYS, 2010, 6390 : 13 - 31
  • [36] Symmetric LDPC codes are not necessarily locally testable
    Ben-Sasson, Eli
    Maatouk, Ghid
    Shpilka, Amir
    Sudan, Madhu
    2011 IEEE 26TH ANNUAL CONFERENCE ON COMPUTATIONAL COMPLEXITY (CCC), 2011, : 55 - 65
  • [37] LOCALLY TESTABLE CODES REQUIRE REDUNDANT TESTERS
    Ben-Sasson, Eli
    Guruswami, Venkatesan
    Kaufman, Tali
    Sudan, Madhu
    Viderman, Michael
    SIAM JOURNAL ON COMPUTING, 2010, 39 (07) : 3230 - 3247
  • [38] Disassembly and Reuse of Demountable Modular Building Systems
    Yang, Yang
    Luk, Calvin
    Zheng, Bowen
    Hu, Yifei
    Chan, Albert Ping-Chuen
    JOURNAL OF MANAGEMENT IN ENGINEERING, 2025, 41 (01)
  • [39] Building blocks for adaptive modular sensing systems
    Jain, Anita
    Naish, Michael D.
    2007 IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN AND CYBERNETICS, VOLS 1-8, 2007, : 3046 - 3051
  • [40] TOWARDS DESIGNING MODULAR OF INDUSTRIALIZED BUILDING SYSTEMS
    Delfani, Mohsen
    Ibrahim, Rahinah
    Raschid, Mohammad Yazah Mat
    Hejazi, Farzad
    Haron, Nuzul Azam
    JURNAL TEKNOLOGI, 2016, 78 (05): : 387 - 391
12345