Simulating Charge Collection Efficiency in a CMOS Pixel Array for X-ray detection

被引：1

作者：

Leonel Corzi, Damian ^{[1
]}

Lipovetzky, Jose

Perez, Martin

Gabriela Gutierrez, Silvina

Sofo Haro, Miguel

Alcalde Bessia, Fabricio

Gomez Berisso, Mariano

机构：

[1] Univ Nacl Cuyo, Ctr Atom Bariloche, Consejo Nacl Invest Cient & Tecn CONICET, Av E Bustillo 9500,R8402AGP, San Carlos De Bariloche, Rio Negro, Argentina

来源：

2022 ARGENTINE CONFERENCE ON ELECTRONICS (CAE) | 2022年

关键词：

CMOS image sensor; ionizing radiation; X-rays; spectroscopy; THE-SHELF CMOS;

D O I：

10.1109/CAE54497.2022.9762498

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

CMOS image sensors can be used for high-resolution X-ray spectroscopy by considering only photons detected in individual pixels. This work studies how the charge is collected by a single pixel when an X-ray photon is absorbed in different regions of a pixel array of an image sensor.

引用

页码：26 / 30

页数：5

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