Double-stub impedance matching algorithm

被引：0
|
作者：
Vian, James [1 ]
机构：
[1] MIT, Lincoln Lab, Lexington, MA 02420 USA
来源：
2007 IEEE ANTENNAS AND PROPAGATION SOCIETY INTERNATIONAL SYMPOSIUM, VOLS 1-12 | 2007年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：4052 / 4055
页数：4
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