Miniband-related 1.4-1.8 μm luminescence of Ge/Si quantum dot superlattices

被引:35
|
作者
Talalaev, V. G. [1 ,2 ,3 ]
Cirlin, G. E. [1 ,4 ]
Tonkikh, A. A. [1 ,4 ]
Zakharov, N. D. [1 ]
Werner, P. [1 ]
Goesele, U. [1 ]
Tomm, J. W. [2 ]
Elsaesser, T. [2 ]
机构
[1] Max Planck Inst Mikrostrukturphys, D-06120 Halle, Germany
[2] Max Born Inst Nichtlineare Opt & Kurzzeitspekrosk, D-12489 Berlin, Germany
[3] St Petersburg State Univ, VA Fock Inst Phys, St Petersburg 198504, Russia
[4] RAS, Ioffe Phys Tech Inst, St Petersburg 194021, Russia
来源
NANOSCALE RESEARCH LETTERS | 2006年 / 1卷 / 02期
基金
俄罗斯基础研究基金会;
关键词
D O I
10.1007/s11671-006-9004-x
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The luminescence properties of highly strained, Sb-doped Ge/Si multi-layer heterostructures with incorporated Ge quantum dots (QDs) are studied. Calculations of the electronic band structure and luminescence measurements prove the existence of an electron miniband within the columns of the QDs. Miniband formation results in a conversion of the indirect to a quasi-direct excitons takes place. The optical transitions between electron states within the miniband and hole states within QDs are responsible for an intense luminescence in the 1.4-1.8 mu m range, which is maintained up to room temperature. At 300 K, a light emitting diode based on such Ge/Si QD superlattices demonstrates an external quantum efficiency of 0.04% at a wavelength of 1.55 mu m.
引用
收藏
页码:137 / 153
页数:17
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