Warpage Analysis of Fan-Out Panel-Level Packaging Using Equivalent CTE

被引:14
|
作者
Tsai, C. H. [1 ]
Liu, S. W. [1 ]
Chiang, K. N. [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Power Mech Engn, Hsinchu 300, Taiwan
关键词
Packaging; Curing; Finite element analysis; Epoxy resins; Semiconductor device modeling; Mathematical model; Simulation; Warpage; equivalent coefficient of thermal expansion; CTE; FEM; post-molding curing; PMC;
D O I
10.1109/TDMR.2019.2956049
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this study, we developed a simple method to obtain the equivalent coefficient of thermal expansion (CTE) by comparing the results of the finite element method (FEM) with the experimental results. This equivalent CTE was used to effectively describe the final mechanical/chemical shrinkage behavior after post-molding curing (PMC). During fan-out panel-level packaging, the chemical/molding shrinkage, curing and temperature cool down processes can cause excessive warpage of the panel structure. When this warpage becomes excessively large, the subsequent processing is substantially more difficult. Thus, it is important to be able to accurately predict structural warpage before manufacturing. FEMs are commonly used to estimate panel warpage during molding, however, the shrinkage behavior of the epoxy resin during molding and the material properties after curing are difficult to fit, and a much experimentation is usually required to obtain the temperature-dependent material properties of the molding compound and parameters required for the empirical equation, e.g., PVTC (Pressure Volume Temperature Cure). Furthermore, the simulation results from these empirical equations are often inconsistent with the experimental results. However, our results showed that under various geometric conditions, the equivalent CTE remained almost constant, and thus can be used in FEM as a reliable material property to predict the warpage after a panel PMC process.
引用
收藏
页码:51 / 57
页数:7
相关论文
共 50 条
  • [31] Demonstration on Warpage Estimation Approach Utilized in Fan-Out Panel-Level Packaging Enabled by Multi-Scale Process-Oriented Simulation
    Wang, Chi-Wei
    Chang, Che-Pei
    Lee, Chang-Chun
    2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS, 2023,
  • [32] A Closer Look to Fan-out Panel Level Packaging
    Braun, Tanja
    Hoelck, Ole
    Voitel, Marcus
    Obst, Mattis
    Voges, Steve
    Becker, Karl-Friedrich
    Aschenbrenner, Rolf
    Schneider-Ramelow, Martin
    2023 7TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM, 2023,
  • [33] Potential and Challenges of Fan-out Panel Level Packaging
    Braun, Tanja
    Becker, Karl-Friedrich
    Kahle, Ruben
    Raatz, Stefan
    Toepper, Michael
    Aschenbrenner, Rolf
    Voges, Steve
    Woehrmann, Markus
    Lang, Klaus-Dieter
    2016 IEEE CPMT SYMPOSIUM JAPAN (ICSJ), 2016, : 132 - 136
  • [34] Trends in Fan-out Wafer and Panel Level Packaging
    Braun, Tanja
    Becker, Karl-Friedrich
    Woehrmann, Markus
    Toepper, Michael
    Boettcher, Lars
    Aschenbrenner, Rolf
    Lang, Klaus-Dieter
    2017 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP), 2017, : 325 - 327
  • [35] Warpage and Thermal Characterization of Fan-out Wafer-Level Packaging
    Lau, John
    Li, Ming
    Tian, DeWen
    Fan, Nelson
    Kuah, Eric
    Kai, Wu
    Li, Margie
    Hao, JiYuen
    Cheung, Ken
    Li, Zhang
    Tan, Kim Hwee
    Beica, Rozalia
    Ko, Cheng-Ta
    Chen, Yu-Hua
    Lim, Sze Pei
    Lee, Ning Cheng
    Wee, Koh Sau
    Ran, Jiang
    Xi, Cao
    2017 IEEE 67TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2017), 2017, : 595 - 602
  • [36] Molding Compound Effects on Warpage of Fan-out Wafer Level Packaging
    Liu, Yan-Cheng
    Cheng, Hsien-Chie
    Wu, Zong-Da
    2018 20TH INTERNATIONAL CONFERENCE ON ELECTRONIC MATERIALS AND PACKAGING (EMAP), 2018,
  • [37] Warpage and Thermal Characterization of Fan-Out Wafer-Level Packaging
    Lau, John H.
    Li, Ming
    Tian, Dewen
    Fan, Nelson
    Kuah, Eric
    Kai, Wu
    Li, Margie
    Hao, J.
    Cheung, Yiu Ming
    Li, Zhang
    Tan, Kim Hwee
    Beica, Rozalia
    Taylor, Thomas
    Ko, Cheng-Ta
    Yang, Henry
    Chen, Yu-Hua
    Lim, Sze Pei
    Lee, Ning Cheng
    Ran, Jiang
    Xi, Cao
    Wee, Koh Sau
    Yong, Qingxiang
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2017, 7 (10): : 1729 - 1738
  • [38] Warpage Simulation and Optimization of Panel Level Fan-out Embedded Package
    Cui, Ruibin
    Kuang, Ziliang
    Yang, Guannan
    Cui, Chengqiang
    Zhang, Yu
    2020 21ST INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2020,
  • [39] Development and Demonstration on Process-Oriented Warpage Simulation Methodology of Fan-Out Panel-Level Package in Multilevel Integration
    Lee, Chang-Chun
    Chang, Che-Pei
    Huang, Pei-Chen
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2023, 13 (12): : 2016 - 2023
  • [40] Thermal cycling test and simulation of fan-out chip-last panel-level packaging for heterogeneous integration
    Lau J.H.
    Ko C.-T.
    Peng C.-Y.
    Yang K.-M.
    Xia T.
    Lin P.B.
    Chen J.-J.
    Huang P.-C.
    Tseng T.-J.
    Lin E.
    Chang L.
    Lin C.
    Fan Y.-J.
    Liu H.-N.
    Lu W.
    Journal of Microelectronics and Electronic Packaging, 2021, 18 (02): : 29