Temperature dependence of electrical properties of electrodeposited Ni-based nanowires

The influence of annealing on the microstructure and the electrical properties of cylindrical nickel-based nanowires has been investigated. Nanowires of nickel of nominally 200 nm diameter and of permalloy (Py) of nominally 70 nm were fabricated by electrochemical deposition into nanoporous templates of polycarbonate and anodic alumina, respectively. Characterization was carried out on as-grown nanowires and nanowires heat treated at 650 degrees C. Transmission electron microscopy and diffraction imaging of as-grown and annealed nanowires showed temperature-correlated grain growth of an initially nano-crystalline structure with <= 8 nm (Ni) and <= 20 nm (Py) grains towards coarser poly-crystallinity with grain sizes up to about 160 nm (Ni) and 70 nm (Py), latter being limited by the nanowire width. The electrical conductivity of individual as-grown and annealed Ni nanowires was measured in situ within a scanning electron microscope environment. At low current densities, the conductivity of annealed nanowires was estimated to have risen by a factor of about two over as-grown nanowires. We attribute this increase, at least in part, to the observed grain growth. The annealed nanowire was subsequently subjected to increasing current densities. Above 120 kA mm(-2) the nanowire resistance started to rise. At 450 kA mm(-2) the nanowire melted and current flow ceased.