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- [31] Experimental Demonstration of Field-Free STT-Assisted SOT-MRAM (SAS-MRAM) With Four Bits per SOT Programming LineIEEE ELECTRON DEVICE LETTERS, 2024, 45 (10) : 1800 - 1803论文数: 引用数: h-index:机构:Xue, Fen论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USASong, Ming-Yuan论文数: 0 引用数: 0 h-index: 0机构: Taiwan Semicond Mfg Co Ltd, Corp Res, Hsinchu 30075, Taiwan Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USAHsu, Chen-Feng论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USAChen, T. C.论文数: 0 引用数: 0 h-index: 0机构: Taiwan Semicond Mfg Co Ltd, Corp Res, San Jose, CA 95134 USA Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USATsai, Wilman论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USABao, Xinyu论文数: 0 引用数: 0 h-index: 0机构: Taiwan Semicond Mfg Co Ltd, Corp Res, San Jose, CA 95134 USA Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USAWang, Shan X.论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, Dept Elect Engn, Dept Mat Sci & Engn, Stanford, CA 94305 USA Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA
- [32] A Comprehensive Study of Temperature and Its Effects in SOT-MRAM DevicesMICROMACHINES, 2023, 14 (08)Hadamek, Tomas论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Christian Doppler Lab Nonvolatile Magnetoresist Me, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Christian Doppler Lab Nonvolatile Magnetoresist Me, Gusshausstr 27-29, A-1040 Vienna, AustriaJorstad, Nils Petter论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Christian Doppler Lab Nonvolatile Magnetoresist Me, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Christian Doppler Lab Nonvolatile Magnetoresist Me, Gusshausstr 27-29, A-1040 Vienna, Austriade Orio, Roberto Lacerda论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Christian Doppler Lab Nonvolatile Magnetoresist Me, Gusshausstr 27-29, A-1040 Vienna, AustriaGoes, Wolfgang论文数: 0 引用数: 0 h-index: 0机构: Silvaco Europe Ltd, Cambridge PE27 5JL, England TU Wien, Inst Microelect, Christian Doppler Lab Nonvolatile Magnetoresist Me, Gusshausstr 27-29, A-1040 Vienna, AustriaSelberherr, Siegfried论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Christian Doppler Lab Nonvolatile Magnetoresist Me, Gusshausstr 27-29, A-1040 Vienna, AustriaSverdlov, Viktor论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Christian Doppler Lab Nonvolatile Magnetoresist Me, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Christian Doppler Lab Nonvolatile Magnetoresist Me, Gusshausstr 27-29, A-1040 Vienna, Austria
- [33] Magnetization Switching in Atom-Thick Mo Engineered Exchange Bias-Based SOT-MRAMSPIN, 2023,Zhao, Dongyan论文数: 0 引用数: 0 h-index: 0机构: Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaChen, Yanning论文数: 0 引用数: 0 h-index: 0机构: Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R China Beijing Chip Identicat Technol Co Ltd, Beijing 102200, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaChen, Zanhong论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Inst, Sch Integrated Circuit Sci & Engn, MIIT Key Lab Spintron, Beijing, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaPan, Cheng论文数: 0 引用数: 0 h-index: 0机构: Beijing Chip Identicat Technol Co Ltd, Beijing 102200, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaShao, Jin论文数: 0 引用数: 0 h-index: 0机构: Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaDu, Ao论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Inst, Sch Integrated Circuit Sci & Engn, MIIT Key Lab Spintron, Beijing, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaCai, Wenlong论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Inst, Sch Integrated Circuit Sci & Engn, MIIT Key Lab Spintron, Beijing, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaCao, Kaihua论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Inst, Sch Integrated Circuit Sci & Engn, MIIT Key Lab Spintron, Beijing, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaFu, Zhen论文数: 0 引用数: 0 h-index: 0机构: Beijing Chip Identicat Technol Co Ltd, Beijing 102200, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaShi, Kewen论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Inst, Sch Integrated Circuit Sci & Engn, MIIT Key Lab Spintron, Beijing, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R China
- [34] Variation Aware Evaluation Approach and Design Methodology for SOT-MRAMIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2024, 71 (04) : 1651 - 1664Wang, Chao论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Res Inst, Sch Elect & Informat Engn, MIIT Key Lab Spintron, Beijing 100191, Peoples R China Beihang Univ, Inst Int Innovat, Natl Key Lab Spintron, Yuhang, Hangzhou 311115, Peoples R China Beihang Univ, Fert Beijing Res Inst, Sch Elect & Informat Engn, MIIT Key Lab Spintron, Beijing 100191, Peoples R ChinaWang, Zhaohao论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Res Inst, Sch Elect & Informat Engn, MIIT Key Lab Spintron, Beijing 100191, Peoples R China Beihang Univ, Inst Int Innovat, Natl Key Lab Spintron, Yuhang, Hangzhou 311115, Peoples R China Beihang Univ, Fert Beijing Res Inst, Sch Elect & Informat Engn, MIIT Key Lab Spintron, Beijing 100191, Peoples R ChinaLi, Shixing论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Res Inst, Sch Elect & Informat Engn, MIIT Key Lab Spintron, Beijing 100191, Peoples R China Beihang Univ, Fert Beijing Res Inst, Sch Elect & Informat Engn, MIIT Key Lab Spintron, Beijing 100191, Peoples R ChinaZhang, Zhongkui论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Res Inst, Sch Elect & Informat Engn, MIIT Key Lab Spintron, Beijing 100191, Peoples R China Beihang Univ, Fert Beijing Res Inst, Sch Elect & Informat Engn, MIIT Key Lab Spintron, Beijing 100191, Peoples R ChinaZhang, Youguang论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Res Inst, Sch Elect & Informat Engn, MIIT Key Lab Spintron, Beijing 100191, Peoples R China
- [35] SOT-MRAM读电路泄电结构优化中国集成电路, 2024, (06) : 43 - 47王超论文数: 0 引用数: 0 h-index: 0机构: 中国电子科技集团公司第五十八研究所吴晨烨论文数: 0 引用数: 0 h-index: 0机构: 中国电子科技集团公司第五十八研究所叶海波论文数: 0 引用数: 0 h-index: 0机构: 中国电子科技集团公司第五十八研究所陆楠楠论文数: 0 引用数: 0 h-index: 0机构: 中国电子科技集团公司第五十八研究所李嘉威论文数: 0 引用数: 0 h-index: 0机构: 中国电子科技集团公司第五十八研究所孙杰杰论文数: 0 引用数: 0 h-index: 0机构: 中国电子科技集团公司第五十八研究所
- [36] Magnetization Switching in Atom-Thick Mo Engineered Exchange Bias-Based SOT-MRAMSPIN, 2024, 14 (01)Zhao, Dongyan论文数: 0 引用数: 0 h-index: 0机构: Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaChen, Yanning论文数: 0 引用数: 0 h-index: 0机构: Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R China Beijing Chip Identicat Technol Co Ltd, Beijing 102200, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaChen, Zanhong论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Inst, Sch Integrated Circuit Sci & Engn, MIIT Key Lab Spintron, Beijing, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaPan, Cheng论文数: 0 引用数: 0 h-index: 0机构: Beijing Chip Identicat Technol Co Ltd, Beijing 102200, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaShao, Jin论文数: 0 引用数: 0 h-index: 0机构: Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaDu, Ao论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Inst, Sch Integrated Circuit Sci & Engn, MIIT Key Lab Spintron, Beijing, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaCai, Wenlong论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Inst, Sch Integrated Circuit Sci & Engn, MIIT Key Lab Spintron, Beijing, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaCao, Kaihua论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Inst, Sch Integrated Circuit Sci & Engn, MIIT Key Lab Spintron, Beijing, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaFu, Zhen论文数: 0 引用数: 0 h-index: 0机构: Beijing Chip Identicat Technol Co Ltd, Beijing 102200, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R ChinaShi, Kewen论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Fert Beijing Inst, Sch Integrated Circuit Sci & Engn, MIIT Key Lab Spintron, Beijing, Peoples R China Beijing Smart Chip Microelect Technol Co Ltd, Natl & Local Joint Engn Res Ctr Reliabil Technol E, Beijing 102200, Peoples R China
- [37] Low Power SOT-MRAM Cell Configuration For Dual Write Operation2021 INTERNATIONAL CONFERENCE ON ELECTRONICS, INFORMATION, AND COMMUNICATION (ICEIC), 2021,Kim, Jooyoon论文数: 0 引用数: 0 h-index: 0机构: Korea Univ, Sch Elect Engn, Seoul, South Korea Korea Univ, Sch Elect Engn, Seoul, South KoreaBae, Kwanho论文数: 0 引用数: 0 h-index: 0机构: Korea Univ, Sch Elect Engn, Seoul, South Korea Korea Univ, Sch Elect Engn, Seoul, South KoreaPark, Jongsun论文数: 0 引用数: 0 h-index: 0机构: Korea Univ, Sch Elect Engn, Seoul, South Korea Korea Univ, Sch Elect Engn, Seoul, South Korea
- [38] SOT-MRAM Digital PIM Architecture With Extended Parallelism in Matrix MultiplicationIEEE TRANSACTIONS ON COMPUTERS, 2022, 71 (11) : 2816 - 2828Kim, Taehwan论文数: 0 引用数: 0 h-index: 0机构: Korea Univ, Sch Elect Engn, Seoul 136701, South Korea Korea Univ, Sch Elect Engn, Seoul 136701, South KoreaJang, Yunho论文数: 0 引用数: 0 h-index: 0机构: Korea Univ, Sch Elect Engn, Seoul 136701, South Korea Korea Univ, Sch Elect Engn, Seoul 136701, South KoreaKang, Min-Gu论文数: 0 引用数: 0 h-index: 0机构: Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Daejeon 34141, South Korea Korea Univ, Sch Elect Engn, Seoul 136701, South KoreaPark, Byong-Guk论文数: 0 引用数: 0 h-index: 0机构: Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Daejeon 34141, South Korea Korea Univ, Sch Elect Engn, Seoul 136701, South KoreaLee, Kyung-Jin论文数: 0 引用数: 0 h-index: 0机构: Korea Adv Inst Sci & Technol, Dept Phys, Daejeon 34141, South Korea Korea Univ, Sch Elect Engn, Seoul 136701, South KoreaPark, Jongsun论文数: 0 引用数: 0 h-index: 0机构: Korea Univ, Sch Elect Engn, Seoul 136701, South Korea Korea Univ, Sch Elect Engn, Seoul 136701, South Korea
- [39] Demonstration of a manufacturable SOT-MRAM multiplexer array towards industrial applicationsJOURNAL OF SEMICONDUCTORS, 2023, 44 (12)Jiang, Chuanpeng论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaLi, Jinhao论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaZhang, Hongchao论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaLu, Shiyang论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaLi, Pengbin论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaWang, Chao论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaZhang, Zhongkui论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaHou, Zhengyi论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaLiu, Xu论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaFeng, Jiagao论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaZhang, He论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaJin, Hui论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaWang, Gefei论文数: 0 引用数: 0 h-index: 0机构: Truth Memory Corp, Beijing 100088, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaLiu, Hongxi论文数: 0 引用数: 0 h-index: 0机构: Truth Memory Corp, Beijing 100088, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaCao, Kaihua论文数: 0 引用数: 0 h-index: 0机构: Truth Memory Corp, Beijing 100088, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaWang, Zhaohao论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R ChinaZhao, Weisheng论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Integrated Circuit Sci & Engn, Beijing 100191, Peoples R China
- [40] Demonstration of a manufacturable SOT-MRAM multiplexer array towards industrial applicationsJournal of Semiconductors, 2023, (12) : 93 - 100Chuanpeng Jiang论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityJinhao Li论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityHongchao Zhang论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityShiyang Lu论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityPengbin Li论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityChao Wang论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityZhongkui Zhang论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityZhengyi Hou论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityXu Liu论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityJiagao Feng论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityHe Zhang论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityHui Jin论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityGefei Wang论文数: 0 引用数: 0 h-index: 0机构: Truth Memory Corporation School of Integrated Circuit Science and Engineering, Beihang UniversityHongxi Liu论文数: 0 引用数: 0 h-index: 0机构: Truth Memory Corporation School of Integrated Circuit Science and Engineering, Beihang UniversityKaihua Cao论文数: 0 引用数: 0 h-index: 0机构: Truth Memory Corporation School of Integrated Circuit Science and Engineering, Beihang UniversityZhaohao Wang论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang UniversityWeisheng Zhao论文数: 0 引用数: 0 h-index: 0机构: School of Integrated Circuit Science and Engineering, Beihang University School of Integrated Circuit Science and Engineering, Beihang University