Laser nano-engineering with the assistance of scanning probe microscope and optical resonance in microparticles

被引：0
|
作者：
Lu, YF [1 ]
Hu, B [1 ]
Mai, ZH [1 ]
Huang, SM [1 ]
Zhang, L [1 ]
Zheng, YW [1 ]
Luk'yanchuk, BS [1 ]
Song, WD [1 ]
Hong, MH [1 ]
Chong, TC [1 ]
机构：
[1] Natl Univ Singapore, Dept Elect Engn, Laser Microproc Lab, Singapore 119260, Singapore
来源：
CLEO(R)/PACIFIC RIM 2001, VOL I, TECHNICAL DIGEST | 2001年
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：30 / 31
页数：2
相关论文
共 50 条
  • [41] Field enhancement of optical radiation in the nearfield of scanning probe microscope tips
    Jersch, J
    Demming, F
    Hildenhagen, LJ
    Dickmann, K
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (01): : 29 - 34
  • [42] A qPlus-based scanning probe microscope compatible with optical measurements
    Cheng, Bowei
    Wu, Da
    Bian, Ke
    Tian, Ye
    Guo, Chaoyu
    Liu, Kaihui
    Jiang, Ying
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2022, 93 (04):
  • [43] Field enhancement of optical radiation in the nearfield of scanning probe microscope tips
    J. Jersch
    F. Demming
    L.J. Hildenhagen
    K. Dickmann
    Applied Physics A, 1998, 66 : 29 - 34
  • [44] Sensitivity analysis of scanning near-field optical microscope probe
    Fang, TH
    Chang, WJ
    OPTICS AND LASER TECHNOLOGY, 2003, 35 (04): : 267 - 271
  • [45] Optical and electrical characterization at the nanoscale with a transparent probe of a scanning tunnelling microscope
    Sychugov, Ilya
    Omi, Hiroo
    Murashita, Tooru
    Kobayashi, Yoshihiro
    NANOTECHNOLOGY, 2009, 20 (14)
  • [46] Interactive Manipulation of Nonconductive Microparticles in Scanning Electron Microscope by a Virtual Nano-Hand Strategy
    Liu, Mei
    Cheng, Kai
    Qin, Xiangzheng
    Wei, Zhenzhong
    Borom, Brandon
    Su, Weilin
    Chen, Jinbo
    Feng, Yunpeng
    Wang, Tao
    Rao, Jinjun
    MICROMACHINES, 2019, 10 (10)
  • [47] Analysis and preparation of optical fiber probe in scanning near-field optical microscope
    Univ of Science and Technology of, China, Hefei, China
    Guangdian Gongcheng, 2 (20-24):
  • [48] Carbon-nanotube engineering for probes and tweezers operating in scanning probe microscope
    Nakayama, Y
    Akita, S
    NANOTUBE-BASED DEVICES, 2003, 772 : 23 - 34
  • [49] SEM Nano: An Electron Wave Optical Simulation for the Scanning Electron Microscope
    Kamal, Surya
    Hailstone, Richard K.
    MICROSCOPY AND MICROANALYSIS, 2022, 28 (02) : 441 - 453
  • [50] Neighborhood Resonance Phenomenon for Cell Imaging via Scanning Probe Acoustic Microscope
    Li, Xiaoqing
    Deng, Wenjie
    Ding, Mingyue
    MEDICAL IMAGING 2019: ULTRASONIC IMAGING AND TOMOGRAPHY, 2019, 10955
12345