Laser nano-engineering with the assistance of scanning probe microscope and optical resonance in microparticles

被引:0
|
作者
Lu, YF [1 ]
Hu, B [1 ]
Mai, ZH [1 ]
Huang, SM [1 ]
Zhang, L [1 ]
Zheng, YW [1 ]
Luk'yanchuk, BS [1 ]
Song, WD [1 ]
Hong, MH [1 ]
Chong, TC [1 ]
机构
[1] Natl Univ Singapore, Dept Elect Engn, Laser Microproc Lab, Singapore 119260, Singapore
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:30 / 31
页数:2
相关论文
共 50 条
  • [1] LASER SCANNING MICROSCOPE WITH A DIFFERENTIAL HETERODYNE OPTICAL PROBE
    KOMATSU, S
    SUHARA, H
    OHZU, H
    APPLIED OPTICS, 1990, 29 (28): : 4244 - 4249
  • [2] New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope
    Stehling, Nicola
    Masters, Robert
    Zhou, Yangbo
    O'Connell, Robert
    Holland, Chris
    Zhang, Hongzhou
    Rodenburg, Cornelia
    MRS COMMUNICATIONS, 2018, 8 (02) : 226 - 240
  • [3] New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope
    Nicola Stehling
    Robert Masters
    Yangbo Zhou
    Robert O’Connell
    Chris Holland
    Hongzhou Zhang
    Cornelia Rodenburg
    MRS Communications, 2018, 8 : 226 - 240
  • [4] Nano-optical image and probe in a scanning near-field optical microscope
    Hosaka, S
    Shintani, T
    Kikukawa, A
    Itoh, K
    APPLIED SURFACE SCIENCE, 1999, 140 (3-4) : 388 - 393
  • [5] Laser acts as near-field scanning optical microscope probe
    Burgess, DS
    PHOTONICS SPECTRA, 2006, 40 (06) : 129 - 130
  • [7] NEAR-FIELD SCANNING OPTICAL MICROSCOPE WITH A LASER TRAPPED PROBE
    KAWATA, S
    INOUYE, Y
    SUGIURA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1994, 33 (12A): : L1725 - L1727
  • [8] Nano-welding by scanning probe microscope
    Duan, XJ
    Zhang, J
    Ling, X
    Liu, ZF
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2005, 127 (23) : 8268 - 8269
  • [9] Nano-welding by scanning probe microscope
    Duan, Xiaojie
    Zhang, Jin
    Ling, Xing
    Liu, Zhongfan
    Journal of the American Chemical Society, 2005, 127 (23): : 8268 - 8269
  • [10] Evaluation of nano-optical probe from scanning near-field optical microscope images
    Hosaka, S
    Shintani, T
    Kikukawa, A
    Itoh, K
    JOURNAL OF MICROSCOPY-OXFORD, 1999, 194 : 369 - 373