Test beds for complex systems

被引：2
|
作者：
Jones, A [1 ]
Deshmukh, A
机构：
[1] NIST, Enterprise Syst Grp, Mfg Engn Lab, Gaithersburg, MD 20899 USA
[2] Univ Massachusetts, Amherst, MA 01003 USA
来源：
COMMUNICATIONS OF THE ACM | 2005年 / 48卷 / 05期
关键词：
D O I：
10.1145/1060710.1060738
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The role of test beds in complex manufacturing systems is discussed. A value chain represents a complex system in which every decision of every component impacts, in complicated and sometimes unpredictable ways, total system performance. Some of the limitations of traditional approaches to decision making and views of information are also discussed and some latest research directions to overcome some of these limitations are proposed. The two types of test beds needed to support the research include performance test beds and interoperability test beds.
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页码：45 / 50
页数：6
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