Shot noise measurement methods in electronic devices

被引：1

作者：

Chen Wen-Hao ^{[1
]}

Du Lei ^{[1
]}

Zhuang Yi-Qi ^{[2
]}

Bao Jun-Lin ^{[2
]}

He Liang ^{[1
]}

Chen Hua ^{[1
]}

Sun Peng ^{[1
]}

Wang Ting-Lan ^{[1
]}

机构：

[1] Xidian Univ, Sch Technol Phys, Xian 710071, Peoples R China

[2] Xidian Univ, Sch Microelect, Xian 710071, Peoples R China

来源：

ACTA PHYSICA SINICA | 2011年 / 60卷 / 05期

关键词：

shot noise; electronic devices; noise measurement; SUPPRESSION;

D O I：

10.7498/aps.60.050704

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The limitations to shot noise measurement methods based on superconducting quantum interference device (SQUID) and superconductivity-insulation-superconductor (SIS) Josephson junction are pointed out, and a method to measure the shot noises of conventional electronic devices is proposed. Shot noise characteristics of conventional electronic devices are analyzed, and then a low-temperature measurement system is established. By using a double-shielding construction and low noise preamplifier, the test system can achieve a good electromagnetic interference shielding and low background noise. The theoretical and the experimental results of shot noises in diodes at 10 K are in good agreement with each other. The accuracy and the credibility of measurement system are proved.

引用

页数：8

共 30 条

[1] Direct experimental verification of shot noise in short channel MOS transistors
Andersson, S
Svensson, C
[J]. ELECTRONICS LETTERS, 2005, 41 (15) : 869 - 871
[2] Quantum shot noise
Beenakker, C
Schönenberger, C
[J]. PHYSICS TODAY, 2003, 56 (05) : 37 - 42
[3] Shot noise in mesoscopic conductors
Blanter, YM
Büttiker, M
[J]. PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 2000, 336 (1-2): : 1 - 166
[4] Electron-number statistics and shot-noise suppression by Coulomb correlation in nondegenerate ballistic transport
Bulashenko, OM
Mateos, J
Pardo, D
Gonzalez, T
Reggiani, L
Rubi, JM
[J]. PHYSICAL REVIEW B, 1998, 57 (03) : 1366 - 1369
[5] Channel noise modeling of deep submicron MOSFETs
Chen, CH
Deen, MJ
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (08) : 1484 - 1487
[6] SHOT NOISE IN SILICON SCHOTTKY BARRIER DIODES
COWLEY, AM
ZETTLER, RA
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1968, ED15 (10) : 761 - &
[7] Shot-noise suppression in Schottky barrier diodes
Gomila, G
Reggiani, L
Rubí, JM
[J]. JOURNAL OF APPLIED PHYSICS, 2000, 88 (05) : 3079 - 3081
[8] Shot noise in linear macroscopic resistors
Gomila, G
Pennetta, C
Reggiani, L
Sampietro, M
Ferrari, G
Bertuccio, G
[J]. PHYSICAL REVIEW LETTERS, 2004, 92 (22) : 226601 - 1
[9] haralambous C D, 2001, COMM 2001 ICC 2001 I, P2246
[10] Superconducting quantum interference device based resistance bridge for shot noise measurement on low impedance samples
Jehl, X
Payet-Burin, P
Baraduc, C
Calemczuk, R
Sanquer, M
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (06): : 2711 - 2714

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