Bibliometric Analysis Of Patent Literature Based On Nano-technology Classifications

被引：0
|
作者：
Ma, Ning [1 ]
Chang, Zheng-Bin [1 ]
机构：
[1] Shanghai Second Polytech Univ, Shanghai, Peoples R China
来源：
PROCEEDINGS OF THE 2014 INTERNATIONAL CONFERENCE ON SOCIAL SCIENCE | 2014年 / 9卷
关键词：
nano; technical indicators; statistical analysis; bibliometric;
D O I：
暂无
中图分类号：
C [社会科学总论];
学科分类号：
03 ; 0303 ;
摘要：
Using bibliometric method, from the nano patent application distributions, legal status, patent types, technology field distributions, inter-division conditions, etc., this paper does quantitative analysis on the nano patents applied in China in order to have an overview of the nano-technology development from a level.
引用
收藏
页码：400 / 405
页数：6
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