Influence of process parameters on the microstructure of scandium films deposited by electron-beam evaporation

被引:4
|
作者
Wu, Qingying [1 ]
Bing, Wenzeng [1 ]
Long, Xinggui [1 ]
Zhou, Xiaosong [1 ]
Liu, Jinhua [1 ]
Luo, Shunzhong [1 ]
机构
[1] China Acad Engn Phys, Inst Nucl Phys & Chem, Mianyang 621900, Peoples R China
基金
中国国家自然科学基金;
关键词
Scandium film; Electron-beam evaporation; Substrate temperature; Deposition rate; Microstructure; OPTICAL-PROPERTIES; SURFACE-ENERGY; HCP-METALS;
D O I
10.1016/j.vacuum.2011.12.023
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Microstructures of scandium films deposited on molybdenum (Mo) substrates by electron-beam evaporation are investigated. Influences of substrate temperatures and deposition rates are considered. It is found that the microstructural changes of scandium films with the substrate temperatures are consistent with the reported structure-zone models. Sc films, deposited at 5 nm/s with the temperature range of 373-923 K. as well as deposited at 923 K with the deposition rate from 0.5 to 5 nm/s, show a (002) preferred orientation. Both the texture coefficients of (002) peaks and the grain sizes increase with the substrate temperature. For films deposited at various deposition rates, the films show smoother surfaces at the lower deposition rate. Moreover, the grain sizes first increase with the increasing deposition rate and then decrease with it. The largest grain size (similar to 246 nm) is obtained at the deposition rate of 5 nm/s. The texture coefficients of the (002) preferred orientation decrease when the deposition rate increases from 0.5 nm/s to 5 nm/s. And the preferred growth of the film disappears at deposition rate of 10 nm/s. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1347 / 1352
页数:6
相关论文
共 50 条
  • [21] STRUCTURE AND PROPERTIES OF REFRACTORY COMPOUNDS DEPOSITED BY ELECTRON-BEAM EVAPORATION
    BUNSHAH, RF
    NIMMAGADDA, R
    DUNFORD, W
    MOVCHAN, BA
    DEMCHISHIN, AV
    CHURSANOV, NA
    THIN SOLID FILMS, 1978, 54 (01) : 85 - 106
  • [22] CARBON-FILMS OF ORIENTED MULTILAYERED NANOTUBES DEPOSITED ON KBR AND GLASS BY ELECTRON-BEAM EVAPORATION
    CHERNOZATONSKII, LA
    KOSAKOVSKAJA, ZJ
    KISELEV, AN
    KISELEV, NA
    CHEMICAL PHYSICS LETTERS, 1994, 228 (1-3) : 94 - 99
  • [23] DIELECTRIC-PROPERTIES OF YTTERBIUM AND DYSPROSIUM OXIDE-FILMS DEPOSITED BY ELECTRON-BEAM EVAPORATION
    WIKTORCZYK, T
    WESOLOWSKA, C
    VACUUM, 1987, 37 (1-2) : 107 - 109
  • [24] YTTRIUM OXIDE FILMS PREPARED BY ELECTRON-BEAM EVAPORATION
    SAYER, M
    MARTIN, MS
    HELLICAR, NJ
    THIN SOLID FILMS, 1970, 6 (05) : R61 - &
  • [25] ELECTRON-BEAM EVAPORATION METHOD FOR OBTAINING DIELECTRIC FILMS
    PANKOV, YD
    KAMIN, VA
    ANDREEV, SS
    PRIBORY I TEKHNIKA EKSPERIMENTA, 1975, (05): : 228 - 229
  • [26] Comparison of TiO2 and ZrO2 films deposited by electron-beam evaporation and by sol-gel process
    Yao, Jian-Ke
    Li, Hai-Yuan
    Fan, Zheng-Xiu
    Tang, Yong-Xing
    Jin, Yun-Xia
    Zhao, Yuan-An
    He, Hong-Bo
    Shao, Jian-Da
    CHINESE PHYSICS LETTERS, 2007, 24 (07) : 1964 - 1966
  • [27] Rate-Dependent Evolution of Microstructure and Stress in Silicon Films Deposited by Electron Beam Evaporation
    Dahl-Hansen, Runar Plunnecke
    Stange, Marit
    Sunde, Tor Olav
    Ulyashin, Alexander
    COATINGS, 2024, 14 (07)
  • [28] Optical properties of scandium oxide films prepared by electron beam evaporation
    Al-Kuhaili, MF
    THIN SOLID FILMS, 2003, 426 (1-2) : 178 - 185
  • [29] Influence of oxidization temperature on Zn(O,S) films deposited by electron beam evaporation
    Chen, Chao
    Cheng, Shuying
    Zhang, Hong
    Zhou, Haifang
    Jia, Hongjie
    CRYSTAL RESEARCH AND TECHNOLOGY, 2016, 51 (05) : 354 - 359
  • [30] Hard and superhard TiAlBN coatings deposited by twin electron-beam evaporation
    Rebholz, C.
    Monclus, M. A.
    Baker, M. A.
    Mayrhofer, P. H.
    Gibson, P. N.
    Leyland, A.
    Matthews, A.
    SURFACE & COATINGS TECHNOLOGY, 2007, 201 (13): : 6078 - 6083