Electron transport properties of Ni and Cr thin films

被引:8
|
作者
Abdul-Razzaq, W [1 ]
Amoruso, M [1 ]
机构
[1] W Virginia Univ, Dept Phys, Eberly Coll Arts & Sci, Morgantown, WV 26506 USA
来源
PHYSICA B | 1998年 / 253卷 / 1-2期
关键词
electron transport; Ni; Cr; thin films; magnetoresistance;
D O I
10.1016/S0921-4526(98)00382-2
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The change in resistivity as a function of temperature and the magnetoresistivity of Ni and Cr thin films with thicknesses of 300, 500 and 1000 Angstrom were studied using a four probe technique. It was determined that Ni exhibits anistropic magnetoresistance which is typical of ferromagnetic systems. However, an unexpected region of positive magnetoresistivity occurred in all the Ni samples when the magnetic field was oriented perpendicular to the current but in the plane of the sample. The presence of this positive magnetoresistivity in Ni films implies that interlayer-coupling is not responsible for the similar positive magnetoresistivity behavior observed recently by other workers in Ni/Cu multilayers. Analysis of the magnetoresistivity for Cr samples indicates that the 500 and 1000 A samples are antiferromagnets. The 300 A sample, however, showed an unusual magnetic behavior and further study of this sample is necessary to accurately characterize its magnetic state. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:47 / 51
页数:5
相关论文
共 50 条
  • [41] Study of the Transport Properties and Domain Structure of Thin CoPt Films Obtained by Electron Evaporation
    M. V. Stepushkin
    V. E. Sizov
    A. V. Zdoroveishchev
    I. L. Kalentieva
    E. N. Mirgorodskaya
    A. G. Temiryazev
    M. P. Temiryazeva
    Journal of Communications Technology and Electronics, 2021, 66 : 868 - 872
  • [42] Study of the Transport Properties and Domain Structure of Thin CoPt Films Obtained by Electron Evaporation
    Stepushkin, M., V
    Sizov, V. E.
    Zdoroveishchev, A., V
    Kalentieva, I. L.
    Mirgorodskaya, E. N.
    Temiryazev, A. G.
    Temiryazeva, M. P.
    JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS, 2021, 66 (07) : 868 - 872
  • [43] Temperature dependent electron transport properties of degenerate SnO2 thin films
    Boyali, E.
    Baran, V.
    Asar, T.
    Ozcelik, S.
    Kasap, M.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 692 : 119 - 123
  • [44] Probe Microscopy and Electron-Transport Properties of Thin Mo Epitaxial Films on Sapphire
    L. A. Fomin
    I. V. Malikov
    V. A. Berezin
    A. V. Chernykh
    A. B. Loginov
    B. A. Loginov
    Technical Physics, 2020, 65 : 1748 - 1754
  • [45] Influence of disorder on the electron transport properties in fluorinated copper-phthalocyanine thin films
    Schön, JH
    Bao, ZA
    JOURNAL OF APPLIED PHYSICS, 2001, 89 (06) : 3526 - 3528
  • [46] Probe Microscopy and Electron-Transport Properties of Thin Mo Epitaxial Films on Sapphire
    Fomin, L. A.
    Malikov, I. V.
    Berezin, V. A.
    Chernykh, A. V.
    Loginov, A. B.
    Loginov, B. A.
    TECHNICAL PHYSICS, 2020, 65 (11) : 1748 - 1754
  • [47] Fabrication and Properties of Porous Ni Thin Films
    Choi, Sun Hee
    Kim, Woo Sik
    Kim, Sung Moon
    Lee, Jong-Ho
    Son, Ji-Won
    Kim, Joosun
    JOURNAL OF THE KOREAN CERAMIC SOCIETY, 2006, 43 (05) : 265 - 269
  • [48] MAGNETIC-PROPERTIES OF CR/NI MULTILAYERED FILMS
    YAMAUCHI, K
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1992, 113 (1-3) : 221 - 226
  • [49] MAGNETIC PROPERTIES OF NI-FE-CR FILMS
    COHEN, MS
    JOURNAL OF APPLIED PHYSICS, 1964, 35 (3P2) : 834 - &
  • [50] Difference in charge transport properties of Ni-Nb thin films with native and artificial oxide
    Trifonov, A. S.
    Lubenchenko, A. V.
    Polkin, V. I.
    Pavolotsky, A. B.
    Ketov, S. V.
    Louzguine-Luzgin, D. V.
    JOURNAL OF APPLIED PHYSICS, 2015, 117 (12)