A calibration mechanism based on the principles of the Michelson interferometer micro-thrust test device

被引：2
|
作者：
Yan, Biao [1 ,2 ]
Wang, Hai [1 ,2 ]
Yang, Chunlai [1 ,2 ]
Wen, Li [3 ]
机构：
[1] Anhui Polytech Univ, Sch Mech & Automot Engn, Wuhu 241000, Peoples R China
[2] Anhui Key Lab Adv Numer Control & Servo Technol, Wuhu 241000, Peoples R China
[3] Univ Sci & Technol China, Dept Precis Machinery & Precis Instrumentat, Hefei, Anhui, Peoples R China
来源：
MODERN PHYSICS LETTERS B | 2017年 / 31卷 / 24期
基金：
美国国家科学基金会;
关键词：
Thrust test; electrostatic thrust; voltage;
D O I：
10.1142/S0217984917502116
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A micro-thrust test system based on Michelson interferometer was proposed and tested. The relationship between thrust and output voltage of the calibration component in the system was calculated and verified with numerical modeling. The fitting function of the calibration component was obtained, which will be tested during future thrust test experiments.
引用
收藏
页数：9
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