Oxide formation in thin PbS films under electron irradiation

被引:0
|
作者
Zimin, SP
Zaikina, RF
Borzova, GA
机构
[1] Yaroslavl State Univ, Yaroslavl 150000, Russia
[2] Res Inst Expt & Theoret Phys, Almaty, Kazakhstan
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中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The surface structure of thin lead sulfide films irradiated with 4-MeV electrons was studied by xray diffraction and Auger electron spectroscopy. The 80- to 200-nm-thick surface layer of the irradiated films was found to contain oxides of complex composition.
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页码:1159 / 1161
页数:3
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