The origin of S4+ detected in silicate glasses by XANES

被引：87
|
作者：
Wilke, Max [1 ]
Jugo, Pedro J. [2 ,3 ]
Klimm, Kevin [4 ]
Susini, Jean [5 ]
Botcharnikov, Roman [6 ]
Kohn, Simon C. [3 ]
Janousch, Markus [7 ]
机构：
[1] Univ Potsdam, Inst Geowissensch, D-14476 Golm, Germany
[2] Laurentian Univ, Dept Earth Sci, Sudbury, ON P3E 2C6, Canada
[3] Univ Frankfurt, Inst Geowissensch, D-60438 Frankfurt, Germany
[4] Univ Bristol, Dept Earth Sci, Bristol BS8 1RJ, Avon, England
[5] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[6] Leibniz Univ Hannover, Inst Mineral, D-30167 Hannover, Germany
[7] Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland
来源：
AMERICAN MINERALOGIST | 2008年 / 93卷 / 01期
基金：
英国自然环境研究理事会;
关键词：
XAS; (XAFS; XANES); sulfur K-edge; glass properties; sulfur oxidation state; beam damage; sulfur speciation;
D O I：
10.2138/am.2008.2765
中图分类号：
P3 [地球物理学]; P59 [地球化学];
学科分类号：
0708 ; 070902 ;
摘要：
The origin of sulfite (S4+) species in silicate glasses was evaluated using XANES at the S K-edge. Systematic investigations show that the presence of S4+ species in silicate glasses is an analytical artifact related to changes in the sulfur species caused by irradiation with an electron beam during EMPA or by irradiation with an intense focused X-ray beam during synchrotron analysis. The data shown here indicate that S2- and S6+ are the only significant sulfur species occurring in silicate glasses synthesized under geologically relevant conditions.
引用
收藏
页码：235 / 240
页数：6
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