Field emission from microstructured thin liquid metal films

被引：0
|
作者：
Mitterauer, J [1 ]
机构：
[1] VIENNA TECH UNIV,INST ALLGEMEINE ELEKTROTECH & ELEKTRON,A-1040 VIENNA,AUSTRIA
来源：
ISDEIV - XVIITH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, PROCEEDINGS, VOLS I AND II | 1996年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：737 / 741
页数：5
相关论文
共 50 条
  • [41] Theoretical study of the threshold field for field electron emission from amorphous diamond thin films
    Xu, NS
    She, JC
    Huq, SE
    Deng, SZ
    Chen, J
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (03): : 1059 - 1063
  • [42] Wavelet neural networks model on threshold electric field of field emission from thin films
    Cui, WZ
    Zhu, CC
    Liu, JH
    ACTA PHYSICA SINICA, 2004, 53 (05) : 1583 - 1587
  • [43] Electron emission from thin semiconducting films controlled by an internal electric field
    Pedagogical Univ, Czestochowa, Poland
    Electron Technology (Warsaw), 1996, 29 (2-3): : 329 - 333
  • [44] The model of photo- and field electron emission from thin DLC films
    Litovchenko, VG
    Evtukh, AA
    Litvin, YM
    Fedorchenko, MI
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2003, 353 (1-2): : 47 - 51
  • [45] Emission waveguiding in organic thin films supported by metal
    Wakamatsu, Takashi
    Fujimura, Ryushi
    Kajikawa, Kotaro
    APPLIED OPTICS, 2017, 56 (03) : 482 - 486
  • [46] EMISSION OF HOT ELECTRONS FORM THIN METAL FILMS
    TOMCHUK, PM
    FEDOROVI.RD
    SOVIET PHYSICS SOLID STATE,USSR, 1966, 8 (01): : 226 - +
  • [47] Electron field emission from amorphous carbon thin films as a function of annealing
    Forrest, RD
    Burden, AP
    Khan, RUA
    Silva, SRP
    SURFACE & COATINGS TECHNOLOGY, 1998, 108 (1-3): : 577 - 582
  • [48] FIELD INDUCED COALESCENCE IN THIN METAL FILMS
    AHILEA, E
    HIRSCH, AA
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 698 - &
  • [49] Laser microstructured metal thin films as promising alternative for indium based transparent electrodes
    Eckhardt, Sebastian
    Siebold, Mathias
    Lasagni, Andres Fabian
    OPTICS EXPRESS, 2016, 24 (06): : A553 - A568
  • [50] Lifecycle studies of field emission of BN thin films
    Song, FQ
    Zhang, L
    Han, M
    Huang, HB
    Fan-Li
    Ge, J
    Wan, JG
    Wang, GH
    PHYSICA B-CONDENSED MATTER, 2005, 366 (1-4) : 200 - 204
12345