Determination of the cause of arcing faults in low voltage switchboards

被引:0
|
作者
Land, HB [1 ]
机构
[1] Johns Hopkins Univ, Appl Phys Lab, Laurel, MD 20723 USA
关键词
arc; are fault; arc forensics; electric breakdown; fires; power system protection; power distribution faults; switchgear; switchgear fires; voltage breakdown;
D O I
暂无
中图分类号
U6 [水路运输]; P75 [海洋工程];
学科分类号
0814 ; 081505 ; 0824 ; 082401 ;
摘要
It is widely recognized that arcing faults in switchboards contain large amounts of power and can create significant damage including melting switchboards, destroying substations, disabling ships, and causing human fatalities. While arcing faults occur with a fairly high frequency, electricity is so ubiquitous in our lives that most engineers will not personally be associated with a major arcing fault. The Navy has invested twenty five years investigating the causes, behavior, and prevention of arcing failures in low and medium voltage switchboards. Laboratory testing used to help understand the behavior of arcs in switchboards is presented. That data is then used to analyze actual switchboard arcing events and thus to determine the root causes of the events. Additional testing used to confirm the cause of each event is discussed.
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页码:125 / 132
页数:8
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