Achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas

被引：0
|
作者：
Hsieh, K-L [1 ]
机构：
[1] Natl Taitung Univ, Dept Informat Management, Taitung, Taiwan
来源：
JOURNAL OF SCIENTIFIC & INDUSTRIAL RESEARCH | 2007年 / 66卷 / 11期
关键词：
backpropagation neural network inodel; critical areas; critical layers; liquid crystal displays (LCDs); stepwise regression technique;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this Study, a procedure is proposed to address achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas. Besides, an illustrative case owing to TFT-LCD manufacturer at Tainan Science Park in Taiwan has been applied to verify rationality and feasibility of proposed procedure.
引用
收藏
页码：891 / 897
页数：7
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