Apparent tunneling barrier height and local work function of atomic arrays

被引：3
|
作者：
Noei, Neda [1 ]
Weismann, Alexander [1 ]
Berndt, Richard [1 ]
机构：
[1] Christian Albrechts Univ Kiel, Inst Expt & Angew Phys, D-24098 Kiel, Germany
来源：
BEILSTEIN JOURNAL OF NANOTECHNOLOGY | 2018年 / 9卷
关键词：
scanning tunneling microscopy; tunneling barrier height; work function; METAL-SURFACES;
D O I：
10.3762/bjnano.9.283
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Spatially resolved measurements of the apparent tunneling barrier height Phi(app) in scanning tunneling microscopy have been used to estimate variations of the local work function Phi of surface structures. We experimentally show that Phi(app) can fail as a measure of Phi. The discrepancies are attributed to a kinetic-energy contribution to Phi(app). This contribution depends on the lateral extent of the tunneling current filament and, consequently, on the local surface structure.
引用
收藏
页码：3048 / 3052
页数：5
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