Optimization of the antireflection coating of thin epitaxial crystalline silicon solar cells

被引:10
|
作者
Selj, Josefine K. [1 ]
Young, David [2 ]
Grover, Sachit [2 ]
机构
[1] Inst Energy Technol, N-2007 Kjeller, Norway
[2] Natl Renewable Energy Lab, Golden, CO 80401 USA
关键词
antireflection coating; epitaxial silicon solar cell;
D O I
10.1016/j.egypro.2015.07.035
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
In this work we use an effective weighting function to include the internal quantum efficiency (IQE) and the effective thickness, T-e, of the active cell layer in the optical modeling of the antireflection coating (ARC) of very thin crystalline silicon solar cells. The spectrum transmitted through the ARC is hence optimized for efficient use in the given cell structure and the solar cell performance can be improved. For a 2-mu m thick crystalline silicon heterojunction solar cell the optimal thickness of the Indium Tin Oxide (ITO) ARC is reduced by similar to 8 nm when IQE data and effective thickness are taken into account compared to the standard ARC optimization, using the AM1.5 spectrum only. The reduced ARC thickness will shift the reflectance minima towards shorter wavelengths and hence better match the absorption of very thin cells, where the short wavelength range of the spectrum is relatively more important than the long, weakly absorbed wavelengths. For this cell, we find that the optimal thickness of the ITO starts at 63 nm for very thin (1 pm) active Si layer and then increase with increasing Te until it saturates at 71 nm for T-e > 30 mu m. (C) 2015 The Authors. Published by Elsevier Ltd. This is an open access article, under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
引用
收藏
页码:248 / 252
页数:5
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