Measuring mixed-signal substrate coupling

被引：4
|
作者：
Rolain, Y [1 ]
Van Moer, W
Vandersteen, G
van Heijningen, M
机构：
[1] Free Univ Brussels, Elect Measurement Dept, Brussels, Belgium
[2] IMEC, Louvain, Belgium
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2001年 / 50卷 / 04期
关键词：
high frequency measurements; mixed signal measurements; substrate noise; time domain network analyzer;
D O I：
10.1109/19.948307
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A measurement method is proposed to characterize the substrate coupling between digital and analog sections of a mixed-signal CMOS chip. Induced noise and spurious signals can be measured by a custom-designed analog sensor. This paper proposes a method that, when given such a sensor, allows to measure the crosstalk between digital and analog chip sections. Calibrated sampling scope measurements illustrate the performance of the measurement setup.
引用
收藏
页码：959 / 964
页数：6
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