Etchability of latent fission fragment tracks in CR-39

被引:2
|
作者
Rana, Mukhtar Ahmed [1 ]
机构
[1] PINSTECH, Directorate Sci, Div Phys, Islamabad, Pakistan
关键词
D O I
10.1088/0256-307X/24/11/025
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We report the chemical etching behaviour of the CR-39 polymer detector exposed to fission fragments of Cf-252 describing etchability of latent tracks, whic are like nanocylinders. The fission fragment exposed detectors were etched in 1-7 N NaOH water solutions at temperatures 50-80 degrees C for 45 min in the case of track lingth and 180 min in the case of track diameter measurements. The reduced etch rate S (called here etchability) is determined using experimental results for all etching conditions and the etching conditions with the highest reduced etch are obtained. Physics and energetics of bulk and track etching are discussed. Possible effects causing spurious changes in determination of activation energy of etching are investigated.
引用
收藏
页码:3107 / 3110
页数:4
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