共 50 条
- [44] Optical microcantilever consisting of channel waveguide for scanning near-field optical microscopy controlled by atomic force [J]. JOURNAL OF MICROSCOPY-OXFORD, 1999, 194 : 388 - 392
- [45] Characterization of materials and devices by near-field scanning optical microscopy [J]. DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS PROCESSING II, 1996, 406 : 171 - 182
- [46] Near-field scanning optical microscopy and spectroscopy for semiconductor characterization [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1995, 152 (01): : 257 - 268
- [48] Near-Field Scanning Optical Microscopy Studies of Materials and Devices [J]. MRS Bulletin, 1997, 22 : 27 - 30
- [50] OPTICAL CHARACTERIZATION OF NANOSOURCES USED IN SCANNING NEAR-FIELD OPTICAL MICROSCOPY [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1995, 12 (04): : 695 - 703