Biometric-genetic analysis of genotype dissimilarity in diallel crosses of spring wheat

被引：1
|
作者：
Smiryaev, A. V. [1 ]
Pyl'nev, V. V. [1 ]
机构：
[1] Russian State Agrarian Univ, KA Timiryazev Agr Acad, Moscow 127550, Russia
来源：
RUSSIAN JOURNAL OF GENETICS | 2008年 / 44卷 / 02期
关键词：
Plant Height; Polymorphic Locus; Spring Wheat; Growth Trait; Winter Wheat Cultivar;
D O I：
10.1134/S1022795408020178
中图分类号：
Q3 [遗传学];
学科分类号：
071007 ; 090102 ;
摘要：
A new biometric-genetic model and parameters described in [2] have been used for analysis of pair dissimilarity between spring wheat cultivars and F-1 hybrids obtained by diallel crossing. The dissimilarity between shape of the reactions of different genotypes estimated by a growth trait (plant height) served as a metric. The mode of inheritance of dissimilarity has been determined, and the cultivars that are the most dissimilar in allelic composition have been detected.
引用
收藏
页码：234 / 239
页数：6
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