Auger electron spectroscopy and X-ray photoelectron spectroscopy -: Principle and applications

被引：0
|
作者：
Barthés-Labrousse, MGV [1 ]
机构：
[1] CNRS, CECM, F-94407 Vitry Sur Seine, France
来源：
VIDE-SCIENCE TECHNIQUE ET APPLICATIONS | 2003年 / 58卷 / 308期
关键词：
electron spectroscopy; Auger electron spectroscopy; AES; photoelectron spectroscop; XPS; ESCA;
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
This paper gives a short description of the physical principle and main characteristics of Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS).
引用
收藏
页码：353 / +
页数：11
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