Auger electron spectroscopy and X-ray photoelectron spectroscopy -: Principle and applications

被引：0

作者：

Barthés-Labrousse, MGV ^{[1
]}

机构：

[1] CNRS, CECM, F-94407 Vitry Sur Seine, France

来源：

VIDE-SCIENCE TECHNIQUE ET APPLICATIONS | 2003年 / 58卷 / 308期

关键词：

electron spectroscopy; Auger electron spectroscopy; AES; photoelectron spectroscop; XPS; ESCA;

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

This paper gives a short description of the physical principle and main characteristics of Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS).

引用

页码：353 / +

页数：11

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