Atomic structure of Si(001)-c(4 x 4) formed by heating processes after wet cleaning and its first-principles study

被引:3
|
作者
Endo, K
Ono, T
Arima, K
Uesugi, Y
Hirose, K
Mori, Y
机构
[1] Osaka Univ, Res Ctr Ultraprecis Sci & Technol, Suita, Osaka 5650871, Japan
[2] Osaka Univ, Dept Precis Sci & Technol, Suita, Osaka 5650871, Japan
关键词
Si(001); c(4 x 4) surface reconstruction; heating process; wet cleaning; STM; LEED; first-principles simulation;
D O I
10.1143/JJAP.42.4646
中图分类号
O59 [应用物理学];
学科分类号
摘要
In order to yield an atomically flat Si(001) reconstructed surface at as low a temperature as possible, 2-step heating processes after wet cleaning are proposed based on thermal desorption spectroscopy (TDS) spectra. They are pre-annealing at 300degreesC for 60 min, and subsequent flashing at 650degreesC. The pre-annealing desorbs one hydrogen atom at each-dihydride on the surface, and the flashing desorbs the rest of the hydrogen atoms. Furthermore, for practical device processes, it is proposed that the 2-step heating processes should be performed in a hydrogen ambient to prevent the surface from adsorbing contaminations. Scanning tunneling microscopy (STM) and low energy electron diffraction (LEED) observations reveal that an atomically flat Si(001)-c(4 x 4) surface is obtained by flashing at 650degreesC in not only ultrahigh vacuum, but also in hydrogen ambient. STM images and first-principles simulations demonstrate that the Si(001)-c(4 x 4) structure is explained by a missing-dimer model.
引用
收藏
页码:4646 / 4649
页数:4
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