Measurement of birefringence in nonlinear crystals by Michelson interferometer

被引:0
|
作者
Choi, Hee Joo [1 ]
Kim, Byeong Joo [1 ]
Lim, Hwan Hong [1 ]
Cha, Myoungsik [1 ]
机构
[1] Pusan Natl Univ, Dept Phys, Pusan 609735, South Korea
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a method to measure the index of refraction of a wafer-type material accurately by using a modified Michelson interferometer. With this method, the difference between the refractive index of the ordinary-wave and that of the extraordinary-wave in the representative nonlinear crystal, LiNbO3 could be measured with ease.
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页码:469 / 470
页数:2
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