Measurement of birefringence in nonlinear crystals by Michelson interferometer

被引：0
|
作者：
Choi, Hee Joo [1 ]
Kim, Byeong Joo [1 ]
Lim, Hwan Hong [1 ]
Cha, Myoungsik [1 ]
机构：
[1] Pusan Natl Univ, Dept Phys, Pusan 609735, South Korea
来源：
2007 PACIFIC RIM CONFERENCE ON LASERS AND ELECTRO-OPTICS, VOLS 1-4 | 2007年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present a method to measure the index of refraction of a wafer-type material accurately by using a modified Michelson interferometer. With this method, the difference between the refractive index of the ordinary-wave and that of the extraordinary-wave in the representative nonlinear crystal, LiNbO3 could be measured with ease.
引用
收藏
页码：469 / 470
页数：2
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