Performance of synchrotron X-ray monochromators under heat load - Part 1: finite element modeling

被引：18

作者：

Zhang, L ^{[1
]}

Hoszowska, J ^{[1
]}

Migliore, JS ^{[1
]}

Mocella, V ^{[1
]}

Ferrero, C ^{[1
]}

Freund, AK ^{[1
]}

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 467卷

关键词：

crystal monochromator; thermal deformation; finite element modeling; cooling; rocking curve;

D O I：

10.1016/S0168-9002(01)00335-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this paper we present the details of the finite element modeling (FEM) procedure used to calculate the thermal deformation generated by the X-ray power absorbed in silicon crystals. Different parameters were varied systematically such as the beam footprint on the crystal, the reflection order and the white beam slit settings. Moreover, the influence of various cooling parameters such as the cooling coefficient and the temperature of the coolant were studied. The finite element meshing was carefully optimized to generate a deformation output that could be easily read by a diffraction simulation code. Comparison with the experiments shows that the peak-to-valley slope error calculated by the FEM is an excellent approximation of the rocking curve width for a liquid nitrogen cooled silicon (3 3 3) crystal, and a quite good approximation for significantly deformed silicon (111) crystals. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：409 / 413

页数：5

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