Concolic Test Generation for PLC Programs using Coverage Metrics

被引:0
|
作者
Bohlender, Dimitri [1 ]
Simon, Hendrik [1 ]
Friedrich, Nico [1 ]
Kowalewski, Stefan [1 ]
Hauck-Stattelmann, Stefan [2 ]
机构
[1] Rhein Westfal TH Aachen, Informat Embedded Software 11, Aachen, Germany
[2] ABB Corp Res Germany, Ladenburg, Germany
来源
2016 13TH INTERNATIONAL WORKSHOP ON DISCRETE EVENT SYSTEMS (WODES) | 2016年
关键词
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
This paper presents a technique for fully automated generation of test cases for PLC programs adhering to the IEC 61131-3 standard. While previous methods strive for completeness and therefore struggle with the state explosion we pursue a symbolic execution based approach, dropping completeness but nevertheless achieving similar or even better results in practice. The core component is a symbolic execution engine which chooses the next state to execute, handles constraints emerging during the execution and derives respective test vectors leading to a state. To make for a high coverage of the generated tests, we adopt techniques from concolic testing, allow for use of heuristics to prioritise promising states but also merge states to alleviate the path explosion. We exploit peculiarities of PLC semantics to determine reasonable merge-points and unlike similar approaches even handle unreachable code. To examine the feasibility of our technique we evaluate it on function blocks used in industry.
引用
收藏
页码:432 / 437
页数:6
相关论文
共 50 条
  • [21] Maximizing Test Coverage for Security Threats Using Optimal Test Data Generation
    Hussain, Talha
    Faiz, Rizwan Bin
    Aljaidi, Mohammad
    Khattak, Adnan
    Samara, Ghassan
    Alsarhan, Ayoub
    Alazaidah, Raed
    APPLIED SCIENCES-BASEL, 2023, 13 (14):
  • [22] Towards Automatic Generation of Test Data using Branch Coverage
    Chen, Jifeng
    Yang, Luming
    ICCSSE 2009: PROCEEDINGS OF 2009 4TH INTERNATIONAL CONFERENCE ON COMPUTER SCIENCE & EDUCATION, 2009, : 921 - 925
  • [23] Coverage-directed test generation using symbolic techniques
    Geist, D
    Farkas, M
    Landver, A
    Lichtenstein, Y
    Ur, S
    Wolfsthal, Y
    FORMAL METHODS IN COMPUTER-AIDED DESIGN, 1996, 1166 : 143 - 158
  • [24] Using verification technology for validation coverage analysis and test generation
    Moundanos, D
    Abraham, JA
    16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1998, : 254 - 259
  • [25] Code Coverage Aware Test Generation Using Constraint Solver
    Sykora, Krystof
    Ahmed, Bestoun S.
    Bures, Miroslav
    SOFTWARE ENGINEERING AND FORMAL METHODS, SEFM 2020, 2021, 12524 : 58 - 66
  • [26] Automatic Concolic Test Generation with Virtual Prototypes for Post-silicon Validation
    Cong, Kai
    Xie, Fei
    Lei, Li
    2013 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2013, : 303 - 310
  • [27] AUTOMATED TEST-CASE SELECTION BASED ON TEST COVERAGE METRICS
    MCALLISTER, M
    VUONG, ST
    ALILOVICCURGUS, J
    PROTOCOL TEST SYSTEMS, V, 1993, 11 : 93 - 104
  • [28] Empirical Evaluation of Test Coverage for Functional Programs
    Cheng, Yufeng
    Wang, Meng
    Xiong, Yingfei
    Hao, Dan
    Zhang, Lu
    2016 9TH IEEE INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION (ICST), 2016, : 255 - 265
  • [29] An integration test coverage metric for Java programs
    Debashis Mukherjee
    Rajib Mall
    International Journal of System Assurance Engineering and Management, 2019, 10 : 576 - 601
  • [30] Prediction of Coverage of Expensive Concurrency Metrics Using Cheaper Metrics
    Krena, Bohuslav
    Pluhackova, Hana
    Ur, Shmuel
    Vojnar, Tomas
    COMPUTER AIDED SYSTEMS THEORY - EUROCAST 2017, PT II, 2018, 10672 : 99 - 108