Odd-order probe correction technique for spherical near-field antenna measurements

被引:12
|
作者
Laitinen, TA [1 ]
Pivnenko, S [1 ]
Breinbjerg, O [1 ]
机构
[1] Tech Univ Denmark, Orsted DTU, DK-2800 Lyngby, Denmark
关键词
D O I
10.1029/2004RS003063
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
[1] In this paper, an odd-order probe for spherical near-field antenna measurements is defined. A probe correction technique for odd-order probes is then formulated and tested by computer simulations. The probe correction for odd-order probes is important, since a wide range of realistic antennas belongs to this class. To the authors' knowledge, the proposed technique is the first practical high-order probe correction technique that has been formulated in detail, has been tested, and has been shown to work.
引用
收藏
页码:RS3009 / RS3019
页数:11
相关论文
共 50 条