Probe correction technique for symmetric odd-order probes for spherical near-field antenna measurements

被引：1

作者：

Laitinen, Tommi ^{[1
]}

Pivnenko, Sergey ^{[2
]}

机构：

[1] Helsinki Univ Technol TKK, Radio Lab, Elect & Commun Dept, Espoo 02015, Finland

[2] Orsted DTU Tech Univ Denmark, Electrosci Sect, DK-2800 Lyngby, Denmark

来源：

IEEE ANTENNAS AND WIRELESS PROPAGATION LETTERS | 2007年 / 6卷

关键词：

antenna measurement; odd-order probe; probe correction;

D O I：

10.1109/LAWP.2007.913329

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A probe correction technique for symmetric odd-order probes for spherical near-field antenna measurements is presented. The technique provides computational relaxations in the probe correction compared to the known general high-order and odd-order probe correction techniques.

引用

页码：635 / 638

页数：4

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